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Academic Journal
Myny, K.; Steudel, S.; Smout, S.; Vicca, P.; Furthner, F.; van der Putten, B.; Tripathi, A.K.; Gelinck, G.H.; Genoe, J.; Dehaene, W.; Heremans, P.
In Organic Electronics 2010 11(7):1176-1179
Conference
Loffler, J.; Wipliez, L.; Heijna, M. C. R.; Slooff-Hoek, L. H.; de Keijzer, M. A.; Bosman, J.; Soppe, W. J.; Schoonderbeek, A.; Rubingh, J. E. J. M.; Furthner, F.; Kruijt, P. G. M.
2011 37th IEEE Photovoltaic Specialists Conference Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE. :003451-003454 Jun, 2011
Conference
EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on. :1-4 Apr, 2009
Academic Journal
In: Microelectronic Engineering . (Microelectronic Engineering, April 2010, 87(4):641-647)
Conference
Heremans, P.; Genoe, J.; Steudel, S.; Myny, K.; Smout, S.; Vicca, P.; Grillberger, C.; Hild, O.R.; Furthner, F.; van der Putten, B.; Tripathi, A.K.; Gelinck, G.H.
2009 IEEE International Electron Devices Meeting (IEDM); 2009, p1-4, 4p
Academic Journal
Péter, M.; Furthner, F.; Rensing, P.A.; Van Heck, G.T.; Schoo, H.F.M.; Van Breemen, A.J.J.M.; Meinders, E.R.; Schüler, T.; Möllier, R.; Fritzsche, W.
In: Langmuir . (Langmuir, 5 May 2009, 25(9):5384-5390)
Academic Journal
In: Thin Solid Films . (Thin Solid Films, 31 March 2009, 517(10):3081-3086)
Conference
Hu, J.; Chen, Y.L.; Chen, K.H.; Lee, B.; Tsai, F.; Ke, C.M.; Liao, C.H.; Ngo, D.; Gosali, B.; Huang, V.; Tu, W.; Tijssen, R.; Noot, M.; Escalante Marun, M.; Leewis, C.; Staals, F.; Van Veen, M.; Furthner, F.; Young, S.; Bhattacharyya, K.; Luijten, C.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXX. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9778)
Conference
Myny, K.; Steudel, S.; Vicca, P.; Smout, S.; Genoe, J.; Dehaene, W.; Heremans, P.; Beenhakkers, M.J.; Van Aerle, N.A.J.M.; Furthner, F.; Van Der Putten, B.; Tripathi, A.K.; Gelinck, G.H.
In: Analog Circuit Design - Robust Design, Sigma Delta Converters, RFID , Analog Circuit Design - Robust Design, Sigma Delta Converters, RFID. (Analog Circuit Design - Robust Design, Sigma Delta Converters, RFID, 2011, :347-367)
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[AR] Furthner, F.
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