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Characterization and Development of the 4H-SiC/SiO2 Interface for Power MOSFET Applications
Frey, Lothar
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Kaminski, Nando
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Salinaro, Alberto
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Substratkonforme Imprintlithographie für optische Anwendungen
Fader, Robert
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Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy
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Zinc Oxide Thin Film Transistors by Radio Frequency Magnetron Sputtering
Huang, Jiaye
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Ferroelectricity in yttrium-doped hafnium oxide
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Solid-phase epitaxy of silicon amorphized by implantation of the alkali elements rubidium and cesium
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Characterization and Development of the 4H-SiC/SiO2 Interface for Power MOSFET Applications
Salinaro, Alberto
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A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers
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Entwicklung und Herstellung von neuartigen Sonden für die elektrische und optische Rastersondenmikroskopie
Development and production of novel probes for electric and optical scanning probe microscopy
Jambreck, Joachim Dietmar
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Current Voltage Characteristics through Grains and Grain Boundaries of High‐k Dielectric Thin Films Measured by Tunneling Atomic Force Microscopy
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