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Conference
Apra, A.; Ezzouch, R.; Bertrand, B.; Rambal, N.; Catapano, E.; Niebojcwski, H.; Bedecarrats, T.; Hutin, L.; Chanrion, E.; Urdampilleta, M.; Mizokuchi, R.; Bassi, M.; Piot, N.; Vincent, E.; Brun-Barrierc, B.; Zihlmann, S.; Schmitt, V.; Dumur, E.; Jehl, X.; Maurand, R.; Vinet, M.; Meunier, T.; De Franceschi, S.
2021 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2021. :1-2 Jun, 2021
Report
Crippa, A.; Ezzouch, R.; Aprá, A.; Amisse, A.; Houtin, L.; Bertrand, B.; Vinet, M.; Urdampilleta, M.; Meunier, T.; Sanquer, M.; Jehl, X.; Maurand, R.; De Franceschi, S.
Nature Communications 10, 2776 (2019)
Conference
Niquet, Y. M.; Hutin, L.; Diaz, B. Martinez; Venitucci, B.; Li, J.; Michal, V.; Fernandez-Bada, G. Troncoso; Jacquinot, H.; Amisse, A.; Apra, A.; Ezzouch, R.; Piot, N.; Vincent, E.; Yu, C.; Zihlmann, S.; Brun-Barriere, B.; Schmitt, V.; Dumur, E.; Maurand, R.; Jehl, X.; Sanquer, M.; Bertrand, B.; Rambal, N.; Niebojewski, H.; Bedecarrats, T.; Casse, M.; Catapano, E.; Mortemousque, P. A.; Thomas, C.; Thonnart, Y.; Billiot, G.; Morel, A.; Charbonnier, J.; Pallegoix, L.; Niegemann, D.; Klemt, B.; Urdampilleta, M.; El Homsy, V.; Nurizzo, M.; Chanrion, E.; Jadot, B.; Spence, C.; Thiney, V.; Paz, B.; de Franceschi, S.; Vinet, M.; Meunier, T.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :30.1.1-30.1.4 Dec, 2020
Conference
Apra, A.; Crippa, A.; Tagliaferri, M. L. V.; Li, J.; Ezzouch, R.; Bertrand, B.; Hutin, L.; Rambal, N.; Catapano, E.; Niebojewsky, H.; Bedecarrats, T.; Vinet, M.; Urdampilleta, M.; Meunier, T.; Niquet, Y. M.; Dumur, E.; Sanquer, M.; Jehl, X.; Maurand, R.; De Franceschi, S.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :38.4.1-38.4.4 Dec, 2020
Conference
Meunier, T.; Urdampilleta, M.; Niegemann, D.; Jadot, B.; Charion, E.; Mortemousque, P.-A.; Spence, C.; Bertrand, B.; Billiot, G.; Casse, M.; Hutin, L.; Jacquinot, H.; Pillonet, G.; Rambal, N.; Thonnart, Y.; Amisse, A.; Apra, A.; Bourdet, L.; Crippa, A.; Ezzouch, R.; Jehl, X.; Maurand, R.; Niquet, Y.-M.; Sanquer, M.; Venitucci, B.; De Franceschi, S.; Vinet, M.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :31.6.1-31.6.4 Dec, 2019
Academic Journal
Ezzouch, R.; Zihlmann, S.; Aprá, A.; Jehl, X.; Sanquer, M.; De Franceschi, S.; Maurand, R.; Michal, V.P.; Li, J.; Niquet, Y.-M.; Bertrand, B.; Hutin, L.; Vinet, M.; Urdampilleta, M.; Meunier, T.
In: Physical Review Applied . (Physical Review Applied, September 2021, 16(3))
Academic Journal
Crippa, A.; Ezzouch, R.; Aprá, A.; Amisse, A.; Sanquer, M.; Jehl, X.; Maurand, R.; De Franceschi, S.; Laviéville, R.; Hutin, L.; Bertrand, B.; Vinet, M.; Urdampilleta, M.; Meunier, T.
In: Nature Communications . (Nature Communications, 1 December 2019, 10(1))
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