e-Article
'e-Article'
searched 85results | List
1~10
Conference
Mao, S. J.; Liu, J. B.; Wang, Y.; Liu, W. B.; Hu, Y. P.; Cui, H. W.; Zhang, R.; Liu, H. C.; Wang, Z. X.; Zhou, N.; Zhang, Y. K.; Yang, H.; Wu, Z. H.; Li, Y. L.; Gao, J. F.; Du, A. Y.; Li, J. F.; Luo, J.; Wang, W. W.; Yin, H. X.
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P37-1-P37-4 Mar, 2022
Conference
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the. :22-25 Jun, 2014
Periodical
Xiao, Z. R.; Zhu, H. L.; Wang, Q.; Chen, Z.; Liu, Z. Y.; Zhang, Y. K.; Yan, Z. J.; Shi, Y. F.; Zhou, N.; Li, J. J.; Gao, J. F.; Ai, X. Z.; Lu, S. S.; Huang, W. X.; Xiong, W. J.; Kong, Z. Z.; Xiang, J. J.; Zhang, Y.; Zhao, J.; Liu, J. B.; Lu, Y. H.; Bai, G. B.; He, X. B.; Du, A. Y.; Yang, H.; Yang, T.; Wu, Z. H.; Li, J. F.; Luo, J.; Wang, W. W.; Ye, T. C.
IEEE Transactions on Electron Devices; 2023, Vol. 70 Issue: 3 p1380-1385, 6p
Conference
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :243-246 Jul, 2013
Conference
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-5 Jul, 2012
Conference
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the. :1-5 Jul, 2010
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(4):1203-1208 Apr, 2012
Academic Journal
Wang, X. P.; Li, M.-F.; Yu, H. Y.; Yang, J. J.; Chen, J. D.; Zhu, C. X.; Du, A. Y.; Loh, W. Y.; Biesemans, S.; Chin, A.; Lo, G. Q.; Kwong, D.-L.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(1):50-53 Jan, 2008
Academic Journal
Zhang, Yongkui; Ai, Xuezheng; Yin, Xiaogen; Zhu, Huilong; Yang, H.; Wang, G. L.; Li, J. J.; Du, A. Y.; Li, C.; Huang, W. X.; Xie, L.; Li, Y. Y.; Liu, Y. B.; Zhang, Y. B.; Jia, K. P.; Wu, Z. H.; Ma, X. L.; Zhang, Q. Z.; Mao, S. J.; Xu, G. B.
Academic Journal
Tran, X. A.; Yu, H. Y.; Yeo, Y. C.; Wu, L.; Liu, W. J.; Wang, Z. R.; Fang, Z.; Pey, K. L.; Sun, X. W.; Du, A. Y.; Nguyen, B. Y.; Li, M. F.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(3):396-398 Mar, 2011
Refining the search results
Facets
[AR] Du, A. Y.
Publication year
-
Database provider
Title
Publisher
자료유형(Source Type)
Subject
Language