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Academic Journal
Yelton, E.; Larson, C.P.; Iaia, V.; Pechenezhskiy, I.V.; Plourde, B.L.T.; Dodge, K.; La Magna, G.; Catelani, G.; Baity, P.G.; McDermott, R.; Kurinsky, N.A.
In: Physical Review B . (Physical Review B, 1 July 2024, 110(2))
Report
Dodge, K.; Liu, Y.; Klots, A. R.; Cole, B.; Shearrow, A.; Senatore, M.; Zhu, S.; Ioffe, L. B.; McDermott, R.; Plourde, B. L. T.
Physical Review Letters 131, 150602 (2023)
Academic Journal
Liu, C.H.; Patel, S.; Rafferty, O.; Opremcak, A.; McDermott, R.; Ballard, A.; Dodge, K.; Iaia, V.; McBroom, T.; Plourde, B.L.T.; Olaya, D.; Schmidt, D.R.; Biesecker, J.; Lucas, T.; Ullom, J.; Hopkins, P.F.; Benz, S.P.; Dubois, J.L.
In: PRX Quantum . (PRX Quantum, July 2023, 4(3))
Academic Journal
Guryan, J.; Ludwig, J.; Bhatt, M.P.; Cook, P.J.; Davis, J.M.V.; Dodge, K.; Farkas, G.; Fryer, R.G.; Mayer, S.; Pollack, H.; Steinberg, L.; Stoddard, G.
In: American Economic Review . (American Economic Review, March 2023, 113(3):738-765)
Conference
Mukhanov, O.; Kirichenko, A.; Howington, C.; Walter, J.; Hutchings, M.; Vernik, I.; Yohannes, D.; Dodge, K.; Ballard, A.; Plourde, B. L. T.; Opremcak, A.; Liu, C.-H.; McDermott, R.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :31.2.1-31.2.4 Dec, 2019
Academic Journal
Kot, C.Y.; Curtice, C.; DeLand, S.; Dunn, D.C.; Fujioka, E.; Poulin, S.; Halpin, P.N.; Åkesson, S.; Alfaro-Shigueto, J.; Mangel, J.C.; Metcalfe, K.; Amorocho Llanos, D.F.; Antonopoulou, M.; Balazs, G.H.; Parker, D.M.; Baverstock, W.R.; Robinson, D.P.; Blumenthal, J.M.; Broderick, A.C.; Godley, B.J.; Hawkes, L.A.; Rees, A.F.; Snape, R.T.E.; Witt, M.J.; Bruno, I.; Canbolat, A.F.; Casale, P.; Luschi, P.; Cejudo, D.; Varo-Cruz, N.; Coyne, M.S.; DiMatteo, A.; Dodge, K.; Esteban, N.; Formia, A.; Fuentes, M.M.P.B.; Garnier, J.; Hill, N.; Godfrey, M.H.; González Carman, V.; Harrison, A.-L.; Hart, C.E.; Hays, G.C.; Hochscheid, S.; Kaska, Y.; Sözbilen, D.; Levy, Y.; Ley-Quiñónez, C.P.; Sandoval-Lugo, A.G.; Zavala-Norzagaray, A.A.; Lockhart, G.G.; López-Mendilaharsu, M.; Margaritoulis, D.; Maxwell, S.M.; McClellan, C.M.; Read, A.J.; Mingozzi, A.; Moncada, F.G.; Nichols, W.J.; Patel, S.H.; Pilcher, N.J.; Robinson, N.J.; Schofield, G.; Seminoff, J.A.; Seney, E.E.; Tomás, J.; Wallace, B.P.; Wildermann, N.E.
In: Diversity and Distributions . (Diversity and Distributions, April 2022, 28(4):810-829)
Academic Journal
In Journal of the American Medical Directors Association March 2021 22(3):B9-B9
Conference
IGARSS 2008 - 2008 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International. 3:III - 206-III - 209 Jul, 2008
Conference
2006 IEEE International Symposium on Geoscience and Remote Sensing Geoscience and Remote Sensing Symposium, 2006. IGARSS 2006. IEEE International Conference on. :3583-3586 Jul, 2006
Academic Journal
Leonard, E.; Beck, M.A.; Christensen, B.G.; Thorbeck, T.; Opremcak, A.; Pechenezhskiy, I.V.; Dupuis, N.P.; Schlenker, F.; Suttle, J.; Wilen, C.; Zhu, S.; Vavilov, M.G.; McDermott, R.; Nelson, J.; Howington, C.; Dodge, K.; Hutchings, M.D.; Ku, J.; Plourde, B.L.T.
In: Physical Review Applied . (Physical Review Applied, 7 January 2019, 11(1))
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[AR] Dodge, K.
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