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Conference
Veloso, A.; Vermeersch, B.; Chen, R.; Matagne, P.; Bardon, M. Garcia; Eneman, G.; Serbulova, K.; Zografos, O.; Chen, S. H.; Sisto, G.; Jourdain, A.; Arimura, H.; O'Sullivan, B.; De Keersgieter, A.; Hellings, G.; Beyne, E.; Horiguchi, N.; Ryckaert, J.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Tyaginov, S.; Makarov, A.; Chasin, A.; Bury, E.; Vandemaele, M.; Jech, M.; Grill, A.; De Keersgieter, A.; Linten, D.; Kaczer, B.
In Microelectronics Reliability July 2021 122
Conference
Tyaginov, S.E.; Bury, E.; Grill, A.; Yu, Z.; Makarov, A.; De Keersgieter, A.; Vexler, M.I.; Vandemaele, M.; Wang, R.; Spessot, A.; Chasin, A.; Kaczer, B.
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-3 Mar, 2023
Conference
Veloso, A.; Eneman, G.; De Keersgieter, A.; Favia, P.; Hikavyy, A.; Chen, R.; Jourdain, A.; Horiguchi, N.
2022 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2022 International Conference on. :51-54 Sep, 2022
Academic Journal
Veloso, A.; Jourdain, A.; Radisic, D.; Chen, R.; Arutchelvan, G.; O'Sullivan, B.; Arimura, H.; Stucchi, M.; De Keersgieter, A.; Hosseini, M.; Hopf, T.; D'have, K.; Wang, S.; Dupuy, E.; Mannaert, G.; Vandersmissen, K.; Iacovo, S.; Marien, P.; Choudhury, S.; Schleicher, F.; Sebaai, F.; Oniki, Y.; Zhou, X.; Gupta, A.; Schram, T.; Briggs, B.; Lorant, C.; Rosseel, E.; Hikavyy, A.; Loo, R.; Geypen, J.; Batuk, D.; Martinez, G.T.; Soulie, J.P.; Devriendt, K.; Chan, B.T.; Demuynck, S.; Hiblot, G.; Van der Plas, G.; Ryckaert, J.; Beyer, G.; Litta, E.D.; Beyne, E.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7173-7179 Dec, 2022
Academic Journal
Eyben, P.; De Keersgieter, A.; Matagne, P.; Chiarella, T.; Porret, C.; Siew, Y.K.; Goux, L.; Mitard, J.; Horiguchi, N.; Hikavyy, A.
In: Japanese Journal of Applied Physics . (Japanese Journal of Applied Physics, 1 April 2024, 63(4))
Conference
Eyben, P.; De Keersgieter, A.; Celano, U.; Wouters, L.; Chiarella, T.; Ritzenthaler, R.; Mertens, H.; Richard, O.; Paredis, K.; Matagne, P.; Mitard, J.; Horiguchi, N.; Goux, L.
2021 20th International Workshop on Junction Technology (IWJT) Junction Technology (IWJT), 2021 20th International Workshop on. :1-4 Jun, 2021
Academic Journal
Tyaginov, S.; Bury, E.; Grill, A.; Makarov, A.; De Keersgieter, A.; Vandemaele, M.; Spessot, A.; Chasin, A.; Kaczer, B.; Yu, Z.; Wang, R.; Vexler, M.
In: Micromachines . (Micromachines, November 2023, 14(11))
Academic Journal
Eneman, G.; Veloso, A.; Favia, P.; Hikavyy, A.; Porret, C.; Arimura, H.; De Keersgieter, A.; Pourtois, G.; Loo, R.; Spessot, A.; Matagne, P.; Ryckaert, J.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(11):5380-5385 Nov, 2021
Conference
Tyaginov, S.; Makarov, A.; Chasin, A.; Bury, E.; Vandemaele, M.; Jech, M.; Grill, A.; De Keersgieter, A.; Linten, D.; Kaczer, B.
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2020 IEEE International Symposium on the. :1-7 Jul, 2020
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[AR] De Keersgieter, A.
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