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Academic Journal
Ridal, M.; Schimanke, S.; Andrae, U.; Berggren, L.; Edvinsson, L.; Hagelin, S.; Hopsch, S.; Isaksson, L.; Medeiros, P.; Olsson, E.; Unden, P.; Bazile, E.; Le Moigne, P.; Brousseau, P.; El-Said, A.; Glinton, M.; Randriamampianina, R.; Dahlgren, P.; Wang, Z.Q.
In: Quarterly Journal of the Royal Meteorological Society . (Quarterly Journal of the Royal Meteorological Society, 2024)
Academic Journal
Bell, B.; Hersbach, H.; Simmons, A.; Berrisford, P.; Horányi, A.; Muñoz-Sabater, J.; Nicolas, J.; Radu, R.; Schepers, D.; Soci, C.; Villaume, S.; Bidlot, J.-R.; Buontempo, C.; Thépaut, J.-N.; Dahlgren, P.; Haimberger, L.; Woollen, J.
In: Quarterly Journal of the Royal Meteorological Society . (Quarterly Journal of the Royal Meteorological Society, October 2021 Part B, 147(741):4186-4227)
Book
In: Handbook of Digital Politics . (Handbook of Digital Politics, 21 November 2023, :76-91)
Conference
International Test Conference, 2003. Proceedings. ITC 2003. International test conference Test Conference, 2003. Proceedings. ITC 2003. International. 1:755-763 2003
Conference
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) International test conference Test Conference, 1998. Proceedings., International. :363-371 1998
Conference
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) VLSI test VLSI Test Symposium, 1997., 15th IEEE. :117-122 1997
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33rd Design Automation Conference Proceedings, 1996 DAC: design automation Design Automation Conference Proceedings 1996, 33rd. :155-160 1996
Conference
Proceedings of 14th VLSI Test Symposium VLSI test VLSI Test Symposium, 1996., Proceedings of 14th. :414-421 1996
Conference
Proceedings 13th IEEE VLSI Test Symposium VLSI test symposium VLSI Test Symposium, 1995. Proceedings., 13th IEEE. :208-213 1995
Conference
1995 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 1995 IEEE International Symposium on. 3:2124-2127 vol.3 1995
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[AR] Dahlgren, P.
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