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Rodrigues, M. R. D.; Bonasera, A.; Scisciò, M.; Pérez-Hernández, J. A.; Ehret, M.; Filippi, F.; Andreoli, P. L.; Huault, M.; Larreur, H.; Singappuli, D.; Molloy, D.; Raffestin, D.; Alonzo, M.; Rapisarda, G. G.; Lattuada, D.; Guardo, G. L.; Verona, C.; Consoli, Fe.; Petringa, G.; McNamee, A.; La Cognata, M.; Palmerini, S.; Carriere, T.; Cipriani, M.; Di Giorgio, G.; Cristofari, G.; De Angelis, R.; Cirrone, G. A. P.; Margarone, D.; Giuffrida, L.; Batani, D.; Nicolai, P.; Batani, K.; Lera, R.; Volpe, L.; Giulietti, D.; Agarwal, S.; Krupka, M.; Singh, S.; Consoli, Fa.
Academic Journal
Rodrigues, M.R.D.; Bonasera, A.; Rapisarda, G.G.; Lattuada, D.; Guardo, G.L.; Consoli, F.; Petringa, G.; La Cognata, M.; Cirrone, G.A.P.; Giuffrida, L.; Scisciò, M.; Filippi, F.; Andreoli, P.L.; Alonzo, M.; Cipriani, M.; Di Giorgio, G.; Cristofari, G.; De Angelis, R.; Consoli, F.; Pérez-Hernández, J.A.; Ehret, M.; Lera, R.; Volpe, L.; Huault, M.; Larreur, H.; Singappuli, D.; Raffestin, D.; Carriere, T.; Batani, D.; Nicolai, P.; Molloy, D.; McNamee, A.; Margarone, D.; Verona, C.; Palmerini, S.; Batani, K.; Giulietti, D.; Agarwal, S.; Krupka, M.; Singh, S.
In: Matter and Radiation at Extremes . (Matter and Radiation at Extremes, 1 May 2024, 9(3))
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Maitrallain, A.; Bontemps, K.; Atukpor, E.F.; Hannachi, F.; Huber, A.; Tarisien, M.; Marquès, J.-R.; Lancia, L.; Bonvalet, J.; Carrière, T.; D'Humières, E.; Nicolaï, P.; Santos, J.; Tikhonchuk, V.; Bagnoud, V.; Hornung, J.; Zielbauer, B.; Henares, J.L.; Loiseau, P.
In: Journal of Plasma Physics . (Journal of Plasma Physics, 25 April 2024, 90(2))
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In Microelectronics Reliability August-September 2015 55(9-10):1491-1495
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IEEE Transactions on Smart Grid IEEE Trans. Smart Grid Smart Grid, IEEE Transactions on. 11(3):2281-2292 May, 2020
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IEEE Transactions on Smart Grid IEEE Trans. Smart Grid Smart Grid, IEEE Transactions on. 10(6):6933-6944 Nov, 2019
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In Proceedings of the Combustion Institute 2005 30(1):1353-1361
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IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 63(4):2201-2207 Aug, 2016
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In Microelectronics Reliability 2003 43(9):1615-1619
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In Proceedings of the Combustion Institute 2002 29(1):1257-1266
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[AR] Carriere, T.
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