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In Solid State Electronics February 2023 200
Convolution neural network inference using frequency modulation in computational phase-change memory
Conference
Trabelsi, A.; Cagli, C.; Hirtzlin, T.; Martin, S.; Billoint, O.; Vianello, E.; Sousa, V.; Bourgeois, G.; Andrieu, F.
2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-4 Oct, 2023
Academic Journal
Bakkaloǧlu, S.A.; Büyükkaragöz, B.; Leventoǧlu, E.; Delibaş, A.; Döven, S.S.; Taner, S.; Yavuz, S.; Erfidan, G.; Vatansever, E.D.; Aynaci, F.; Yilmaz, K.; Taşdemir, M.; Akaci, O.; Akinci, N.; Güven, S.; Çiçek, N.; Alpay, H.; Türkkan, Ö.N.; Dursun, I.; Poyrazoǧlu, H.; Yel, S.; Inal, G.A.; Köse, S.; Keleşoǧlu, E.; Candan, C.; Göknar, N.; Sancaktar, M.; Alaygut, D.; Mutlubaş, F.; Çamlar, S.A.; Saygili, S.; Gülmez, R.; Sever, L.; Yavaşcan, Ö.; Yilmaz, A.; Aksu, B.; Mahmudova, G.; Gülleroǧlu, K.; Ertan, P.; Demir, B.K.; Pinarbaşi, S.; Gençler, A.; Baştuǧ, F.; Günay, N.; Çeleǧen, K.; Noyan, A.; Parmaksiz, G.; Avci, B.; Çayci, F.Ş.; Bayrakçi, U.; Özlü, S.G.; Aksoy, Ö.Y.; Bayazit, A.K.; Atmiş, B.; Saribaş, E.; Çaǧli, Ç.; Tabel, Y.; Elmas, A.T.; Selçuk, Ş.Z.; Kiliç, B.D.; Kara, M.A.; Büyükçelik, M.; Balat, A.; Tiryaki, B.D.; Erdoǧdu, B.; Dursun, H.; Başaran, C.; Akbulut, B.B.; Düzova, A.; Gülhan, B.; Oruç, Ç.; Peru, H.; Çelakil, M.; Doǧan, K.; Bilge, I.; Pehlivanoǧlu, C.; Alpman, N.; Zeybek, C.; Tülpar, S.; Gülşan, R.Y.Ç.; Kara, A.; Gürgöze, M.K.; Önder, E.N.A.; Atikel, Y.Ö.; Pul, S.; Sönmez, F.; Yildiz, G.; Akman, S.; Elmaci, M.; Küçük, N.; Yüksel, S.; Kavaz, A.; Nalçacioǧlu, H.; Alparslan, C.; Dinçel, N.; Elhan, A.H.
In: Nephrology Dialysis Transplantation . (Nephrology Dialysis Transplantation, 1 September 2024, 39(9):1514-1522)
Conference
Trabelsi, A.; Cagli, C.; Hirtzlin, T.; Cueto, O.; Cyrille, M. C.; Vianello, E.; Meli, V.; Sousa, V.; Bourgeois, G.; Andrieu, F.
ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) Solid State Circuits Conference (ESSCIRC), ESSCIRC 2022- IEEE 48th European. :129-132 Sep, 2022
Academic Journal
In Microelectronic Engineering 5 August 2018 195:101-106
Academic Journal
In Microelectronics Reliability September 2017 76-77:178-183
Academic Journal
In Microelectronic Engineering 25 June 2017 178:61-65
Academic Journal
Azzaz, M.; Benoist, A.; Vianello, E.; Garbin, D.; Jalaguier, E.; Cagli, C.; Charpin, C.; Bernasconi, S.; Jeannot, S.; Dewolf, T.; Audoit, G.; Guedj, C.; Denorme, S.; Candelier, P.; Fenouillet-Beranger, C.; Perniola, L.
In Solid State Electronics November 2016 125:182-188
Conference
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020
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