부산대학교 도서관

Lo, CC; Persaud, A; Dhuey, S; Olynick, D; Borondics, F; Martin, MC; Bechtel, HA; Bokor, J; Schenkel, T

Jhuria K; Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. kaushalya@lbl.gov.; Ivanov V; Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Virginia Tech National Security Institute, Blacksburg, VA, USA.; Polley D; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Department of Physics, BITS Pilani-Hyderabad Campus, Telangana, India.; Zhiyenbayev Y; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Liu W; Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Persaud A; Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Redjem W; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; College of Nanoscale Science and Engineering, SUNY Albany, Albany, NY, USA.; Qarony W; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Parajuli P; Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Ji Q; Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Gonsalves AJ; Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Bokor J; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Tan LZ; Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Kanté B; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Schenkel T; Accelerator Technology and Applied Physics Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. t_schenkel@lbl.gov.

Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE

Meisenheimer PB; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.; Steinhardt RA; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.; Sung SH; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.; Williams LD; Department of Materials Design and Innovation, University at Buffalo - The State University of New York, Buffalo, NY, USA.; Zhuang S; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA.; Nowakowski ME; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Novakov S; Department of Physics, University of Michigan, Ann Arbor, MI, USA.; Torunbalci MM; OxideMEMS Lab, Purdue University, West Lafayette, IN, USA.; Prasad B; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Zollner CJ; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Wang Z; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Dawley NM; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.; Schubert J; Peter Grünberg Institute (PGI-9) and JARA Fundamentals of Future Information Technology, Forschungszentrum Jülich GmbH, Jülich, Germany.; Hunter AH; Michigan Center for Materials Characterization, University of Michigan, Ann Arbor, MI, USA.; Manipatruni S; Components Research, Intel Corporation, Hillsboro, OR, USA.; Nikonov DE; Components Research, Intel Corporation, Hillsboro, OR, USA.; Young IA; Components Research, Intel Corporation, Hillsboro, OR, USA.; Chen LQ; Department of Materials Science and Engineering, Penn State University, State College, PA, USA.; Bokor J; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Bhave SA; OxideMEMS Lab, Purdue University, West Lafayette, IN, USA.; Ramesh R; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Materials Sciences Division, Lawrence Berkeley National Laboratory, CA, USA.; Department of Physics, University of California, Berkeley, CA, USA.; Hu JM; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA.; Kioupakis E; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.; Hovden R; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.; Schlom DG; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA.; Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, Berlin, Germany.; Heron JT; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA. jtheron@umich.edu.

Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE

Goiriena-Goikoetxea, M; Xiao, Z; El-Ghazaly, A; Stan, CV; Chatterjee, J; Ceballos, A; Pattabi, A; Tamura, N; Conte, R Lo; Hellman, F; Candler, R; Bokor, J

Physical Review Materials, vol 5, iss 2

Wu, J; Carlton, D; Oelker, E; Park, J S; Jin, E; Arenholz, E; Scholl, A; Hwang, Chanyong; Bokor, J; Qiu, Z Q

Journal of Physics: Condensed Matter; 9/ 1/2010, Vol. 22 Issue 34, p342001-342004, 4p

Paulo, A S; Black, J; García-Sanchez, D; Esplandiu, M J; Aguasca, A; Bokor, J; Perez-Murano, F; Bachtold, A

Journal of Physics: Conference Series; 2008, Vol. 100 Issue 1, p052009-052013, 5p

Perez, Tristan; Santos-Mujica, Maider; Ruiz-Minguela, Jose Pablo

2009 European Control Conference (ECC). :3743-3748

Choi, YK Choi, Yang-Kyu; Lee, JS; Zhu, J; Somorjai, GA; Lee, LP; Bokor, J

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena. 21:2951-2955

Choi, YK Choi, Yang-Kyu; Ha, D; King, TJ; Bokor, J

Japanese Journal of Applied Physics. 42:2073-2076

Choi, YK Choi, Yang-Kyu; Zhu, J; Grunes, J; Bokor, J; Somorjai, GA

The Journal of Physical Chemistry B. 107:3340-3343

Das S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu.; Hong Z; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, PA, USA.; Stoica VA; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Gonçalves MAP; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg.; Shao YT; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Parsonnet E; Department of Physics, University of California, Berkeley, CA, USA.; Marksz EJ; National Institute of Standards and Technology, Boulder, CO, USA.; Saremi S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; McCarter MR; Department of Physics, University of California, Berkeley, CA, USA.; Reynoso A; Department of Physics, University of California, Berkeley, CA, USA.; Long CJ; National Institute of Standards and Technology, Boulder, CO, USA.; Hagerstrom AM; National Institute of Standards and Technology, Boulder, CO, USA.; Meyers D; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Ravi V; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Prasad B; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Zhou H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Zhang Z; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Wen H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Gómez-Ortiz F; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; García-Fernández P; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Bokor J; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Íñiguez J; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg.; Freeland JW; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Orloff ND; National Institute of Standards and Technology, Boulder, CO, USA.; Junquera J; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Chen LQ; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Salahuddin S; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Muller DA; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA.; Martin LW; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Ramesh R; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. rramesh@berkeley.edu.

Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101155473 Publication Model: Print Cited Medium: Internet ISSN: 1476-4660 (Electronic) Linking ISSN: 14761122 NLM ISO Abbreviation: Nat Mater Subsets: MEDLINE; PubMed not MEDLINE

van den Hof, PMJ; Heuberger, PSC; Bokor, J

IFAC Proceedings Volumes. 27:1169-1174

Gorchon, J; Yang, Y; Bokor, J

Physical Review B, vol 94, iss 2

Das S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu.; Hong Z; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, PA, USA.; Stoica VA; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Gonçalves MAP; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg.; Shao YT; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Parsonnet E; Department of Physics, University of California, Berkeley, CA, USA.; Marksz EJ; National Institute of Standards and Technology, Boulder, CO, USA.; Saremi S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; McCarter MR; Department of Physics, University of California, Berkeley, CA, USA.; Reynoso A; Department of Physics, University of California, Berkeley, CA, USA.; Long CJ; National Institute of Standards and Technology, Boulder, CO, USA.; Hagerstrom AM; National Institute of Standards and Technology, Boulder, CO, USA.; Meyers D; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Ravi V; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Prasad B; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Zhou H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Zhang Z; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Wen H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Gómez-Ortiz F; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; García-Fernández P; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Bokor J; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Íñiguez J; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg.; Freeland JW; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.; Orloff ND; National Institute of Standards and Technology, Boulder, CO, USA.; Junquera J; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Chen LQ; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Salahuddin S; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA.; Muller DA; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA.; Martin LW; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.; Ramesh R; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. rramesh@berkeley.edu.

Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101155473 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1476-4660 (Electronic) Linking ISSN: 14761122 NLM ISO Abbreviation: Nat Mater Subsets: MEDLINE; PubMed not MEDLINE

Holden, Christian; Galeazzi, Roberto; Fossen, Thor; Perez, Tristan

2009 European Control Conference (ECC).

Schmidt, AR; Henry, E; Lo, CC; Wang, Y-T; Li, H; Greenman, L; Namaan, O; Schenkel, T; Whaley, KB; Bokor, J; Yablonovitch, E; Siddiqi, I

Journal of Applied Physics, vol 116, iss 4

Bao W; Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.; Melli M; Caselli N; Riboli F; Wiersma DS; Staffaroni M; Choo H; Ogletree DF; Aloni S; Bokor J; Cabrini S; Intonti F; Salmeron MB; Yablonovitch E; Schuck PJ; Weber-Bargioni A

Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 0404511 Publication Model: Print Cited Medium: Internet ISSN: 1095-9203 (Electronic) Linking ISSN: 00368075 NLM ISO Abbreviation: Science Subsets: PubMed not MEDLINE

Xiao Z; Department of Electrical and Computer Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Advanced Light Source , Lawrence Berkeley National Laboratory , Berkeley 94720 , California , United States.; Lo Conte R; Department of Electrical Engineering and Computer Science , University of California, Berkeley , Berkeley 94720 , California , United States.; Goiriena-Goikoetxea M; Department of Electrical Engineering and Computer Science , University of California, Berkeley , Berkeley 94720 , California , United States.; Department of Electricity and Electronics , University of the Basque Country , Leioa 48940 , Spain.; Chopdekar RV; Advanced Light Source , Lawrence Berkeley National Laboratory , Berkeley 94720 , California , United States.; Lambert CA; Department of Electrical Engineering and Computer Science , University of California, Berkeley , Berkeley 94720 , California , United States.; Li X; Department of Electrical and Computer Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; N'Diaye AT; Advanced Light Source , Lawrence Berkeley National Laboratory , Berkeley 94720 , California , United States.; Shafer P; Advanced Light Source , Lawrence Berkeley National Laboratory , Berkeley 94720 , California , United States.; Tiwari S; Department of Electrical and Computer Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Barra A; Department of Mechanical and Aerospace Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Chavez A; Department of Mechanical and Aerospace Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Mohanchandra KP; Department of Mechanical and Aerospace Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Carman GP; Department of Mechanical and Aerospace Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Wang KL; Department of Electrical and Computer Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Salahuddin S; Department of Electrical Engineering and Computer Science , University of California, Berkeley , Berkeley 94720 , California , United States.; Arenholz E; Advanced Light Source , Lawrence Berkeley National Laboratory , Berkeley 94720 , California , United States.; Bokor J; Department of Electrical Engineering and Computer Science , University of California, Berkeley , Berkeley 94720 , California , United States.; Materials Sciences Division , Lawrence Berkeley National Laboratory , Berkeley 94720 , California , United States.; Candler RN; Department of Electrical and Computer Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; Department of Mechanical and Aerospace Engineering , University of California, Los Angeles , Los Angeles 90095 , California , United States.; California NanoSystems Institute , Los Angeles 90095 , California , United States.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE; PubMed not MEDLINE

San Paulo, A; Bokor, J

Applied Physics Letters, vol 86, iss 8

Yan, XM; Kwon, S; Contreras, AM; Koebel, MM; Bokor, J; Somorjai, GA

CATALYSIS LETTERS; DEC 2005, 105 3-4, p127-p132, 6p.