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Riesebos, L.; Fu, X.; Moueddenne, A. A.; Lao, L.; Varsamopoulos, S.; Ashraf, I.; van Someren, J.; Khammassi, N.; Almudever, C. G.; Bertels, K.
2019 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2019 IEEE International Symposium on. :1-4 May, 2019
Conference
Cadareanu, P.; Reddy C, N.; Almudever, C. G.; Khanna, A.; Raychowdhury, A.; Datta, S.; Bertels, K.; Narayanan, V.; Ventra, M. Di; Gaillardon, P.-E.
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019. :1469-1476 Mar, 2019
Conference
Fu, X.; Riesebos, L.; Rol, M. A.; van Straten, Jeroen; van Someren, J.; Khammassi, N.; Ashraf, I.; Vermeulen, R. F. L.; Newsum, V.; Loh, K. K. L.; de Sterke, J. C.; Vlothuizen, W. J.; Schouten, R. N.; Almudever, C. G.; DiCarlo, L.; Bertels, K.
2019 IEEE International Symposium on High Performance Computer Architecture (HPCA) HPCA High Performance Computer Architecture (HPCA), 2019 IEEE International Symposium on. :224-237 Feb, 2019
Academic Journal
Moreira, M. S.; Guerreschi, G. G.; Vlothuizen, W.; Marques, J. F.; van Straten, J.; Premaratne, S. P.; Zou, X.; Ali, H.; Muthusubramanian, N.; Zachariadis, C.; van Someren, J.; Beekman, M.; Haider, N.; Bruno, A.; Almudever, C. G.; Matsuura, A. Y.; DiCarlo, L.
NPJ Quantum Information; 11/21/2023, Vol. 9 Issue 1, p1-7, 7p
Conference
Fu, X.; Rol, M. A.; Bultink, C. C.; van Someren, J.; Khammassi, N.; Ashraf, I.; Vermeulen, R. F. L.; de Sterke, J. C.; Vlothuizen, W. J.; Schouten, R. N.; Almudever, C. G.; DiCarlo, L.; Bertels, K.
2017 50th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) Microarchitecture (MICRO), 2017 50th Annual IEEE/ACM International Symposium on. :813-825 Oct, 2017
Conference
Almudever, C. G.; Lao, L.; Fu, X.; Khammassi, N.; Ashraf, I.; Iorga, D.; Varsamopoulos, S.; Eichler, C.; Wallraff, A.; Geck, L.; Kruth, A.; Knoch, J.; Bluhm, H.; Bertels, K
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. :836-845 Mar, 2017
Academic Journal
Fu, X.; Rol, M. A.; Bultink, C. C.; van Someren, J.; Khammassi, N.; Ashraf, I.; Vermeulen, R. F. L.; de Sterke, J. C.; Vlothuizen, W. J.; Schouten, R. N.; Almudever, C. G.; DiCarlo, L.; Bertels, K.
IEEE Micro Micro, IEEE. 38(3):40-47 Jun, 2018
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[AR] Almudever, C. G.
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