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Combined XRD and EXAFS characterization of UiO-66 and functionalized UiO-67 MOFs%

Document Type

Journal

Author

Borfecchia, E.; Oyen, S.; Lomachenko, K.; Bouchevreau, B.; Chiari, E.; Agostini, G.; Gianolio, D.; Bordiga, S.; Lillerud, K.; Lamberti, C.

Source

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES; AUG 2014, 70 pC593-pC593, 1p. Supplement: S

Subject

Language

English

ISSN

20532733

Online Access

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