e-Article
Interfacial bonding in W/C and W/B/sub 4/C multilayers
Document Type
Conference
Author
Source
Conference: Topical conference on probing the nanometer scale properties of surfaces and interfaces, Atlanta, GA, USA, 3 Oct 1988; Other Information: Portions of this document are illegible in microfiche products
Subject
Language
English
Abstract
The nature of carbon bonding in W/C and W/B/sub 4/C multilayer structures is investigated by Auger electron spectroscopy (AES). The interfacial roughness in these x-ray mirrors directly affects their use as efficient optical elements. A significant contribution to interfacial roughness is the possible presence of second phases, WC in particular for the W/C and W/B/sub 4/C combinations. AES depth profiling of the multilayer interfaces is used as a direct method to probe for the existence of WC. 8 refs., 4 figs.