KOR

e-Article

Combined soft and hard X-ray ambient pressure photoelectron spectroscopy studies of semiconductor/electrolyte interfaces
Document Type
article
Source
Subject
Ambient pressure
Photoelectron spectroscopy
Solid liquid interface
HAXPES
Atomic
Molecular
Nuclear
Particle and Plasma Physics
Condensed Matter Physics
Physical Chemistry (incl. Structural)
Chemical Physics
Language
Abstract
The development of solar fuel generating materials would greatly benefit from a molecular level understanding of the semiconductor/electrolyte interface and changes in the interface induced by an applied potential and illumination by solar light. Ambient pressure photoelectron spectroscopy techniques with both soft and hard X-rays, AP-XPS and AP-HAXPES respectively, have the potential to markedly contribute to this understanding. In this paper we initially provide two examples of current challenges in solar fuels material development that AP-XPS and AP-HAXPES can directly address. This will be followed by a brief description of the distinguishing and complementary characteristics of soft and hard X-ray AP-XPS and AP-HAXPES and best approaches to achieving monolayer sensitivity in solid/aqueous electrolyte studies. In particular we focus on the detection of surface adsorbed hydroxyl groups in the presence of aqueous hydroxide anions in the electrolyte, a common situation when investigating photoanodes for solar fuel generating applications. The paper concludes by providing an example of a combined AP-XPS and AP-HAXPES study of a semiconductor/aqueous electrolyte interface currently used in water splitting devices specifically the BiVO4/aqueous potassium phosphate electrolyte interface.