KOR

e-Article

Observation of (Hf,Zr)O2 thin films by scanning nonlinear dielectric microscopy / 走査型非線形誘電率顕微鏡による(Hf,Zr)O2薄膜の観察
Document Type
Journal Article
Source
JSAP Annual Meetings Extended Abstracts. 2020, :1241
Subject
14p-A303-7
HfO2
polarization fatigue
scanning nonlinear dielectric microscopy
分極疲労
強誘電体・高誘電率薄膜
強誘電体薄膜
薄膜・表面
非線形比誘電率顕微鏡
Language
Japanese
ISSN
2436-7613