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Reliability tests on millimetre wave 100 nm gate length process for safe operating area evaluation methodology

Document Type

Article

Author

Robin, C.; Delcourt, S.; Theocharis, J.; Neyrolles, K.; Langrez, D.; Latti, J.; Papaioannou, G.

Source

In Microelectronics Reliability November 2023 150

Subject

Language

ISSN

0026-2714

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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