e-Article
Interface roughness and exchange bias - Coercivity ratio in Pulsed-DC magnetron sputtered NiFe/IrMn/CoFe exchange bias trilayers
Document Type
Article
Author
Source
In: Journal of Optoelectronics and Advanced Materials . (Journal of Optoelectronics and Advanced Materials, March-April 2013, 15(3-4):204-210)
Subject
Language
English
ISSN
14544164