e-Article
Impact of duty factor, stress stimuli, and gate drive strength on gate delay degradation with an atomistic trap-based BTI model
Document Type
Conference Paper
Author
Source
In: Proceedings - 15th Euromicro Conference on Digital System Design, DSD 2012 , Proceedings - 15th Euromicro Conference on Digital System Design, DSD 2012. (Proceedings - 15th Euromicro Conference on Digital System Design, DSD 2012, 2012, :1-7)
Subject
Language
English