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Real-time interface investigation on degradation mechanism of organic light-emitting diode by in-operando X-ray spectroscopies

Document Type

Article

Author

Nie, K.; Zhang, H.; McLeod, J.A.; Zhang, D.; Zhou, D.; Xia, Y.; Zhong, J.; Liao, L.; Sun, X.; Guo, J.

Source

In: Organic Electronics. (Organic Electronics, December 2020, 87)

Subject

Language

English

ISSN

15661199

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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