학술논문
'학술논문'
에서 검색결과 45건 | 목록
1~10
Academic Journal
In Surface & Coatings Technology 25 October 2016 304:228-236
Academic Journal
In Progress in Organic Coatings April 2016 93:68-76
Conference
Ramanathan, E.; Jiang, L.; Takmeel, Q.; MaryClaire, S.; Mahalingam, A.K.M.; Ghosh, S.; Donegan, K.; Chandrasekar, A.; Singh, S.; Johanson, H.; Damjanovic, D.; Sun, Z.; Sircar, A.; Eah, S.-K.; Bombardier, C.; DaSilva, A.; O'Brien, B.; Roux, A.; Cucci, B.; Christopher, O.; Montgomery, C.; Venkatasubramanian, V.; Rana, V.; Mody, J.; Shepard, J.; Child, C.; Morganfeld, B.; Sheraw, R.
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2019 30th Annual SEMI. :1-4 May, 2019
Academic Journal
In: Applied Nanoscience (Switzerland) . (Applied Nanoscience (Switzerland), June 2023, 13(6):3867-3873)
Conference
Lee, Rinus T.P.; Petrov, N.; Kassim, J.; Gribelyuk, M.; Yang, J.; Cao, L.; Yeap, K.B.; Shen, T.; Zainuddin, A. N.; Chandrashekar, A.; Ray, S.; Ramanathan, E.; Mahalingam, A. S.; Chaudhuri, R.; Mody, J.; Damjanovic, D.; Sun, Z.; Sporer, R.; Tang, T. J.; Liu, H.; Liu, J.; Krishnan, B.
2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :61-62 Jun, 2018
Conference
Sultan, A.; Desineni, R.; Hassmann, J.; Hoeppner, K.; Ramanathan, E.; Babcock, C.; Chua, K.P.; Teoh, E.; Dai, V.; Yeo, S.; Hui, C.; Capodieci, L.; McGowan, S.; Madge, R.
ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI. :126-129 May, 2013
Conference
Ee, Y. C.; Ng, W. L.; Tan, J. B.; Zhang, F.; Shao, W.; Chua, J. K.; Li, H. X.; Lin, B. F.; Ng, C. W.; Ramanathan, E.
2011 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International. :63-66 Oct, 2011
Conference
Narasimha, S.; Jagannathan, B.; Ogino, A.; Jaeger, D.; Greene, B.; Sheraw, C.; Zhao, K.; Haran, B.; Kwon, U.; Mahalingam, A. K. M.; Kannan, B.; Morganfeld, B.; Dechene, J.; Radens, C.; Tessier, A.; Hassan, A.; Narisetty, H.; Ahsan, I.; Aminpur, M.; An, C.; Aquilino, M.; Arya, A.; Augur, R.; Baliga, N.; Bhelkar, R.; Biery, G.; Blauberg, A.; Borjemscaia, N.; Bryant, A.; Cao, L.; Chauhan, V.; Chen, M.; Cheng, L.; Choo, J.; Christiansen, C.; Chu, T.; Cohen, B.; Coleman, R.; Conklin, D.; Crown, S.; da Silva, A.; Dechene, D.; Derderian, G.; Deshpande, S.; Dilliway, G.; Donegan, K.; Eller, M.; Fan, Y.; Fang, Q.; Gassaria, A.; Gauthier, R.; Ghosh, S.; Gifford, G.; Gordon, T.; Gribelyuk, M.; Han, G.; Han, J.H.; Han, K.; Hasan, M.; Higman, J.; Holt, J.; Hu, L.; Huang, L.; Huang, C.; Hung, T.; Jin, Y.; Johnson, J.; Johnson, S.; Joshi, V.; Joshi, M.; Justison, P.; Kalaga, S.; Kim, T.; Kim, W.; Krishnan, R.; Krishnan, B.; Anil, K.; Kumar, M.; Lee, J.; Lee, R.; Lemon, J.; Liew, S.L.; Lindo, P.; Lingalugari, M.; Lipinski, M.; Liu, P.; Liu, J.; Lucarini, S.; Ma, W.; Maciejewski, E.; Madisetti, S.; Malinowski, A.; Mehta, J.; Meng, C.; Mitra, S.; Montgomery, C.; Nayfeh, H.; Nigam, T.; Northrop, G.; Onishi, K.; Ordonio, C.; Ozbek, M.; Pal, R.; Parihar, S.; Patterson, O.; Ramanathan, E.; Ramirez, I.; Ranjan, R.; Sarad, J.; Sardesai, V.; Saudari, S.; Schiller, C.; Senapati, B.; Serrau, C.; Shah, N.; Shen, T.; Sheng, H.; Shepard, J.; Shi, Y.; Silvestre, M.C.; Singh, D.; Song, Z.; Sporre, J.; Srinivasan, P.; Sun, Z.; Sutton, A.; Sweeney, R.; Tabakman, K.; Tan, M.; Wang, X.; Woodard, E.; Xu, G.; Xu, D.; Xuan, T.; Yan, Y.; Yang, J.; Yeap, K.B.; Yu, M.; Zainuddin, A.; Zeng, J.; Zhang, K.; Zhao, M.; Zhong, Y.; Carter, R.; Lin, C.-H.; Grunow, S.; Child, C.; Lagus, M.; Fox, R.; Kaste, E.; Gomba, G.; Samavedam, S.; Agnello, P.; Sohn, D. K.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017
Academic Journal
IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 30(4):434-439 Nov, 2017
Conference
Zhang, W. Y.; Silvestre, M. C.; Selvam, A.; Ramanathan, E.; Ordonio, C.; Schaller, J.; Shen, T.; Yeap, K. B.; Capasso, C.; Justison, P.; Lee, J. H.
2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :PI.1.1-PI.1.4 Apr, 2015
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[AR] Ramanathan, E.
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