학술논문
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Conference
karim, M. Ahosan ul; Balasubramanian, S.; Peters, L.; Fisher, K.; Dyck, J.; Song, Y.; Luque, M.; Higman, J.; Nigam, T.
2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-4 Oct, 2020
Academic Journal
Mann, R.W.; Zhao, M.; Kwon, O.S.; Cao, X.; Parihar, S.; Ahosan Ul Karim, M.; Higman, J.; Versaggi, J.; Carter, R.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 28(5):1341-1344 May, 2020
Academic Journal
IEEE Access Access, IEEE. 8:91405-91414 2020
Conference
Narasimha, S.; Jagannathan, B.; Ogino, A.; Jaeger, D.; Greene, B.; Sheraw, C.; Zhao, K.; Haran, B.; Kwon, U.; Mahalingam, A. K. M.; Kannan, B.; Morganfeld, B.; Dechene, J.; Radens, C.; Tessier, A.; Hassan, A.; Narisetty, H.; Ahsan, I.; Aminpur, M.; An, C.; Aquilino, M.; Arya, A.; Augur, R.; Baliga, N.; Bhelkar, R.; Biery, G.; Blauberg, A.; Borjemscaia, N.; Bryant, A.; Cao, L.; Chauhan, V.; Chen, M.; Cheng, L.; Choo, J.; Christiansen, C.; Chu, T.; Cohen, B.; Coleman, R.; Conklin, D.; Crown, S.; da Silva, A.; Dechene, D.; Derderian, G.; Deshpande, S.; Dilliway, G.; Donegan, K.; Eller, M.; Fan, Y.; Fang, Q.; Gassaria, A.; Gauthier, R.; Ghosh, S.; Gifford, G.; Gordon, T.; Gribelyuk, M.; Han, G.; Han, J.H.; Han, K.; Hasan, M.; Higman, J.; Holt, J.; Hu, L.; Huang, L.; Huang, C.; Hung, T.; Jin, Y.; Johnson, J.; Johnson, S.; Joshi, V.; Joshi, M.; Justison, P.; Kalaga, S.; Kim, T.; Kim, W.; Krishnan, R.; Krishnan, B.; Anil, K.; Kumar, M.; Lee, J.; Lee, R.; Lemon, J.; Liew, S.L.; Lindo, P.; Lingalugari, M.; Lipinski, M.; Liu, P.; Liu, J.; Lucarini, S.; Ma, W.; Maciejewski, E.; Madisetti, S.; Malinowski, A.; Mehta, J.; Meng, C.; Mitra, S.; Montgomery, C.; Nayfeh, H.; Nigam, T.; Northrop, G.; Onishi, K.; Ordonio, C.; Ozbek, M.; Pal, R.; Parihar, S.; Patterson, O.; Ramanathan, E.; Ramirez, I.; Ranjan, R.; Sarad, J.; Sardesai, V.; Saudari, S.; Schiller, C.; Senapati, B.; Serrau, C.; Shah, N.; Shen, T.; Sheng, H.; Shepard, J.; Shi, Y.; Silvestre, M.C.; Singh, D.; Song, Z.; Sporre, J.; Srinivasan, P.; Sun, Z.; Sutton, A.; Sweeney, R.; Tabakman, K.; Tan, M.; Wang, X.; Woodard, E.; Xu, G.; Xu, D.; Xuan, T.; Yan, Y.; Yang, J.; Yeap, K.B.; Yu, M.; Zainuddin, A.; Zeng, J.; Zhang, K.; Zhao, M.; Zhong, Y.; Carter, R.; Lin, C.-H.; Grunow, S.; Child, C.; Lagus, M.; Fox, R.; Kaste, E.; Gomba, G.; Samavedam, S.; Agnello, P.; Sohn, D. K.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017
Conference
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :529-532 2002
Conference
Bhat, N.; Chen, P.; Tsui, P.; Das, A.; Foisy, M.; Shiho, Y.; Higman, J.; Nguyen, J.-Y.; Gonzales, S.; Collins, S.; Workman, D.
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :931-934 1998
Conference
Proceedings Ninth Annual IEEE International ASIC Conference and Exhibit ASIC ASIC Conference and Exhibit, 1996. Proceedings., Ninth Annual IEEE International. :305-308 1996
Conference
2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :6A.6.1-6A.6.5 Apr, 2015
Conference
Proceedings of 1994 IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International. :157-160 1994
Conference
29th International Conference on Software Engineering (ICSE'07) Software Engineering, 2007. ICSE 2007. 29th International Conference on. :511-518 May, 2007
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[AR] Higman, J.
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