학술논문
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Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(2):288-291 Feb, 2020
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(9):3555-3562 Sep, 2017
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(2):755-759 Feb, 2016
Conference
Narasimha, S.; Jagannathan, B.; Ogino, A.; Jaeger, D.; Greene, B.; Sheraw, C.; Zhao, K.; Haran, B.; Kwon, U.; Mahalingam, A. K. M.; Kannan, B.; Morganfeld, B.; Dechene, J.; Radens, C.; Tessier, A.; Hassan, A.; Narisetty, H.; Ahsan, I.; Aminpur, M.; An, C.; Aquilino, M.; Arya, A.; Augur, R.; Baliga, N.; Bhelkar, R.; Biery, G.; Blauberg, A.; Borjemscaia, N.; Bryant, A.; Cao, L.; Chauhan, V.; Chen, M.; Cheng, L.; Choo, J.; Christiansen, C.; Chu, T.; Cohen, B.; Coleman, R.; Conklin, D.; Crown, S.; da Silva, A.; Dechene, D.; Derderian, G.; Deshpande, S.; Dilliway, G.; Donegan, K.; Eller, M.; Fan, Y.; Fang, Q.; Gassaria, A.; Gauthier, R.; Ghosh, S.; Gifford, G.; Gordon, T.; Gribelyuk, M.; Han, G.; Han, J.H.; Han, K.; Hasan, M.; Higman, J.; Holt, J.; Hu, L.; Huang, L.; Huang, C.; Hung, T.; Jin, Y.; Johnson, J.; Johnson, S.; Joshi, V.; Joshi, M.; Justison, P.; Kalaga, S.; Kim, T.; Kim, W.; Krishnan, R.; Krishnan, B.; Anil, K.; Kumar, M.; Lee, J.; Lee, R.; Lemon, J.; Liew, S.L.; Lindo, P.; Lingalugari, M.; Lipinski, M.; Liu, P.; Liu, J.; Lucarini, S.; Ma, W.; Maciejewski, E.; Madisetti, S.; Malinowski, A.; Mehta, J.; Meng, C.; Mitra, S.; Montgomery, C.; Nayfeh, H.; Nigam, T.; Northrop, G.; Onishi, K.; Ordonio, C.; Ozbek, M.; Pal, R.; Parihar, S.; Patterson, O.; Ramanathan, E.; Ramirez, I.; Ranjan, R.; Sarad, J.; Sardesai, V.; Saudari, S.; Schiller, C.; Senapati, B.; Serrau, C.; Shah, N.; Shen, T.; Sheng, H.; Shepard, J.; Shi, Y.; Silvestre, M.C.; Singh, D.; Song, Z.; Sporre, J.; Srinivasan, P.; Sun, Z.; Sutton, A.; Sweeney, R.; Tabakman, K.; Tan, M.; Wang, X.; Woodard, E.; Xu, G.; Xu, D.; Xuan, T.; Yan, Y.; Yang, J.; Yeap, K.B.; Yu, M.; Zainuddin, A.; Zeng, J.; Zhang, K.; Zhao, M.; Zhong, Y.; Carter, R.; Lin, C.-H.; Grunow, S.; Child, C.; Lagus, M.; Fox, R.; Kaste, E.; Gomba, G.; Samavedam, S.; Agnello, P.; Sohn, D. K.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 38(1):119-122 Jan, 2017
Conference
Wu, Z.-J.G.; Wang, P.-C.; Houghton, T.; Karra, V.; Moy, D.; Nummy, K.; Riggs, D.; Robson, N.; Melville, I.; Giewont, K.; Choi, S.; Gall, M.; Cho, J.-K.; Hirokawa, T.; Bian, Y.; Justison, P.
In: 2023 Optical Fiber Communications Conference and Exhibition, OFC 2023 - Proceedings , 2023 Optical Fiber Communications Conference and Exhibition, OFC 2023 - Proceedings. (2023 Optical Fiber Communications Conference and Exhibition, OFC 2023 - Proceedings, 2023)
Conference
Zhang, W. Y.; Silvestre, M. C.; Selvam, A.; Ramanathan, E.; Ordonio, C.; Schaller, J.; Shen, T.; Yeap, K. B.; Capasso, C.; Justison, P.; Lee, J. H.
2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :PI.1.1-PI.1.4 Apr, 2015
Conference
2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :IT.6.1-IT.6.4 Jun, 2014
Conference
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) Interconnect technology Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International. :202-204 2000
Academic Journal
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[AR] Justison, P.
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