학술논문

발행년
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(예 : 2010-2015)
'학술논문' 에서 검색결과 14건 | 목록 1~10
Conference
Narasimha, S.Jagannathan, B.Ogino, A.Jaeger, D.Greene, B.Sheraw, C.Zhao, K.Haran, B.Kwon, U.Mahalingam, A. K. M.Kannan, B.Morganfeld, B.Dechene, J.Radens, C.Tessier, A.Hassan, A.Narisetty, H.Ahsan, I.Aminpur, M.An, C.Aquilino, M.Arya, A.Augur, R.Baliga, N.Bhelkar, R.Biery, G.Blauberg, A.Borjemscaia, N.Bryant, A.Cao, L.Chauhan, V.Chen, M.Cheng, L.Choo, J.Christiansen, C.Chu, T.Cohen, B.Coleman, R.Conklin, D.Crown, S.da Silva, A.Dechene, D.Derderian, G.Deshpande, S.Dilliway, G.Donegan, K.Eller, M.Fan, Y.Fang, Q.Gassaria, A.Gauthier, R.Ghosh, S.Gifford, G.Gordon, T.Gribelyuk, M.Han, G.Han, J.H.Han, K.Hasan, M.Higman, J.Holt, J.Hu, L.Huang, L.Huang, C.Hung, T.Jin, Y.Johnson, J.Johnson, S.Joshi, V.Joshi, M.Justison, P.Kalaga, S.Kim, T.Kim, W.Krishnan, R.Krishnan, B.Anil, K.Kumar, M.Lee, J.Lee, R.Lemon, J.Liew, S.L.Lindo, P.Lingalugari, M.Lipinski, M.Liu, P.Liu, J.Lucarini, S.Ma, W.Maciejewski, E.Madisetti, S.Malinowski, A.Mehta, J.Meng, C.Mitra, S.Montgomery, C.Nayfeh, H.Nigam, T.Northrop, G.Onishi, K.Ordonio, C.Ozbek, M.Pal, R.Parihar, S.Patterson, O.Ramanathan, E.Ramirez, I.Ranjan, R.Sarad, J.Sardesai, V.Saudari, S.Schiller, C.Senapati, B.Serrau, C.Shah, N.Shen, T.Sheng, H.Shepard, J.Shi, Y.Silvestre, M.C.Singh, D.Song, Z.Sporre, J.Srinivasan, P.Sun, Z.Sutton, A.Sweeney, R.Tabakman, K.Tan, M.Wang, X.Woodard, E.Xu, G.Xu, D.Xuan, T.Yan, Y.Yang, J.Yeap, K.B.Yu, M.Zainuddin, A.Zeng, J.Zhang, K.Zhao, M.Zhong, Y.Carter, R.Lin, C.-H.Grunow, S.Child, C.Lagus, M.Fox, R.Kaste, E.Gomba, G.Samavedam, S.Agnello, P.Sohn, D. K.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017
Conference
2015 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2015 IEEE International. :PI.1.1-PI.1.4 Apr, 2015
Conference
Narasimha, S.Jagannathan, B.Ogino, A.Jaeger, D.Greene, B.Sheraw, C.Zhao, K.Haran, B.Kwon, U.Mahalingam, A.K.M.Kannan, B.Morganfeld, B.Dechene, J.Radens, C.Tessier, A.Hassan, A.Narisetty, H.Ahsan, I.Aminpur, M.An, C.Aquilino, M.Arya, A.Augur, R.Baliga, N.Bhelkar, R.Biery, G.Blauberg, A.Borjemscaia, N.Bryant, A.Cao, L.Chauhan, V.Chen, M.Cheng, L.Choo, J.Christiansen, C.Chu, T.Cohen, B.Coleman, R.Conklin, D.Crown, S.Da Silva, A.Dechene, D.Derderian, G.Deshpande, S.Dilliway, G.Donegan, K.Eller, M.Fan, Y.Fang, Q.Gassaria, A.Gauthier, R.Ghosh, S.Gifford, G.Gordon, T.Gribelyuk, M.Han, G.Han, J.H.Han, K.Hasan, M.Higman, J.Holt, J.Hu, L.Huang, L.Huang, C.Hung, T.Jin, Y.Johnson, J.Johnson, S.Joshi, V.Joshi, M.Justison, P.Kalaga, S.Kim, T.Kim, W.Krishnan, R.Krishnan, B.Anil, K.Kumar, M.Lee, J.Lee, R.Lemon, J.Liew, S.L.Lindo, P.Lingalugari, M.Lipinski, M.Liu, P.Liu, J.Lucarini, S.Ma, W.MacIejewski, E.Madisetti, S.Malinowski, A.Mehta, J.Meng, C.Mitra, S.Montgomery, C.Nayfeh, H.Nigam, T.Northrop, G.Onishi, K.Ordonio, C.Ozbek, M.Pal, R.Parihar, S.Patterson, O.Ramanathan, E.Ramirez, I.Ranjan, R.Sarad, J.Sardesai, V.Saudari, S.Schiller, C.Senapati, B.Serrau, C.Shah, N.Shen, T.Sheng, H.Shepard, J.Shi, Y.Silvestre, M.C.Singh, D.Song, Z.Sporre, J.Srinivasan, P.Sun, Z.Sutton, A.Sweeney, R.Tabakman, K.Tan, M.Wang, X.Woodard, E.Xu, G.Xu, D.Xuan, T.Yan, Y.Yang, J.Yeap, K.B.Yu, M.Zainuddin, A.Zeng, J.Zhang, K.Zhao, M.Zhong, Y.Carter, R.Lin, C.-H.Grunow, S.Child, C.Lagus, M.Fox, R.Kaste, E.Gomba, G.Samavedam, S.Agnello, P.Sohn, D.K.
In: Technical Digest - International Electron Devices Meeting, IEDM, 2017 IEEE International Electron Devices Meeting, IEDM 2017. (Technical Digest - International Electron Devices Meeting, IEDM, 23 January 2018, :29.5.1-29.5.4)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering, Optical Microlithography XXXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10587)
Conference
In: 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference, IITC/AMC 2016, 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference, IITC/AMC 2016. (2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference, IITC/AMC 2016, 8 July 2016, :15-17)
Conference
In: 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2016, 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2016. (2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2016, 13 June 2016, :316-319)
Conference
In: 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2016, 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2016. (2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2016, 13 June 2016, :446-450)
Conference
In: 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015, 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015. (2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015, 22 July 2015, :68-71)
Conference
In: 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015, 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015. (2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015, 22 July 2015, :411-415)
Conference
In: 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015, 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015. (2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2015, 22 July 2015, :408-410)
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[AR] Ordonio, C.
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