학술논문
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Academic Journal
Gu, S.; Chagarov, E.A.; Min, J.; Madisetti, S.; Novak, S.; Oktyabrsky, S.; Kerr, A.J.; Kaufman-Osborn, T.; Kummel, A.C.; Asbeck, P.M.
In Applied Surface Science 30 October 2014 317:1022-1027
Conference
Narasimha, S.; Jagannathan, B.; Ogino, A.; Jaeger, D.; Greene, B.; Sheraw, C.; Zhao, K.; Haran, B.; Kwon, U.; Mahalingam, A. K. M.; Kannan, B.; Morganfeld, B.; Dechene, J.; Radens, C.; Tessier, A.; Hassan, A.; Narisetty, H.; Ahsan, I.; Aminpur, M.; An, C.; Aquilino, M.; Arya, A.; Augur, R.; Baliga, N.; Bhelkar, R.; Biery, G.; Blauberg, A.; Borjemscaia, N.; Bryant, A.; Cao, L.; Chauhan, V.; Chen, M.; Cheng, L.; Choo, J.; Christiansen, C.; Chu, T.; Cohen, B.; Coleman, R.; Conklin, D.; Crown, S.; da Silva, A.; Dechene, D.; Derderian, G.; Deshpande, S.; Dilliway, G.; Donegan, K.; Eller, M.; Fan, Y.; Fang, Q.; Gassaria, A.; Gauthier, R.; Ghosh, S.; Gifford, G.; Gordon, T.; Gribelyuk, M.; Han, G.; Han, J.H.; Han, K.; Hasan, M.; Higman, J.; Holt, J.; Hu, L.; Huang, L.; Huang, C.; Hung, T.; Jin, Y.; Johnson, J.; Johnson, S.; Joshi, V.; Joshi, M.; Justison, P.; Kalaga, S.; Kim, T.; Kim, W.; Krishnan, R.; Krishnan, B.; Anil, K.; Kumar, M.; Lee, J.; Lee, R.; Lemon, J.; Liew, S.L.; Lindo, P.; Lingalugari, M.; Lipinski, M.; Liu, P.; Liu, J.; Lucarini, S.; Ma, W.; Maciejewski, E.; Madisetti, S.; Malinowski, A.; Mehta, J.; Meng, C.; Mitra, S.; Montgomery, C.; Nayfeh, H.; Nigam, T.; Northrop, G.; Onishi, K.; Ordonio, C.; Ozbek, M.; Pal, R.; Parihar, S.; Patterson, O.; Ramanathan, E.; Ramirez, I.; Ranjan, R.; Sarad, J.; Sardesai, V.; Saudari, S.; Schiller, C.; Senapati, B.; Serrau, C.; Shah, N.; Shen, T.; Sheng, H.; Shepard, J.; Shi, Y.; Silvestre, M.C.; Singh, D.; Song, Z.; Sporre, J.; Srinivasan, P.; Sun, Z.; Sutton, A.; Sweeney, R.; Tabakman, K.; Tan, M.; Wang, X.; Woodard, E.; Xu, G.; Xu, D.; Xuan, T.; Yan, Y.; Yang, J.; Yeap, K.B.; Yu, M.; Zainuddin, A.; Zeng, J.; Zhang, K.; Zhao, M.; Zhong, Y.; Carter, R.; Lin, C.-H.; Grunow, S.; Child, C.; Lagus, M.; Fox, R.; Kaste, E.; Gomba, G.; Samavedam, S.; Agnello, P.; Sohn, D. K.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017
Academic Journal
In: Journal of Vacuum Science and Technology B . (Journal of Vacuum Science and Technology B, 1 September 2020, 38(5))
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 37(12):1547-1550 Dec, 2016
Conference
70th Device Research Conference Device Research Conference (DRC), 2012 70th Annual. :103-104 Jun, 2012
Academic Journal
Kerr, A. J.; Chagarov, E.; Gu, S.; Kaufman-Osborn, T.; Madisetti, S.; Wu, J.; Asbeck, P. M.; Oktyabrsky, S.; Kummel, A. C.
Conference
2011 International Semiconductor Device Research Symposium (ISDRS) Semiconductor Device Research Symposium (ISDRS), 2011 International. :1-2 Dec, 2011
Academic Journal
Sasaki, S.; Dropiewski, K.; Madisetti, S.; Tokranov, V.; Yakimov, M.; Oktyabrsky, S.; Bentley, S.; Galatage, R.; Jacob, A.P.
In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics . (Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 1 January 2017, 35(1))
Academic Journal
Sardashti, K.; Hu, K.-T.; Park, S.; Kim, H.; Kummel, A.; Tang, K.; McIntyre, P.; Madisetti, S.; Oktyabrsky, S.; Siddiqui, S.; Sahu, B.; Yoshida, N.; Kachian, J.
In: Applied Surface Science . (Applied Surface Science, 15 March 2016, 366:455-463)
Academic Journal
Sardashti, K.; Hu, K.-T.; Kummel, A.C.; Tang, K.; McIntyre, P.; Madisetti, S.; Oktyabrsky, S.; Siddiqui, S.; Sahu, B.; Yoshida, N.; Kachian, J.; Dong, L.; Fruhberger, B.
In: Applied Physics Letters . (Applied Physics Letters, 4 January 2016, 108(1))
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[AR] Madisetti, S.
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