학술논문
'학술논문'
에서 검색결과 65건 | 목록
1~10
Academic Journal
Nie, X.P.; Yang, X.H.; Ma, Y.; Chen, L.Y.; Yeap, K.B.; Zeng, K.Y.; Li, D.; Pan, J.S.; Wang, X.D.; Cao, Q.P.; Ding, S.Q.; Jiang, J.Z.
In Intermetallics 2012 22:84-91
Academic Journal
Song, X.; Yeap, K.B.; Zhu, J.; Belnoue, J.; Sebastiani, M.; Bemporad, E.; Zeng, K.Y.; Korsunsky, A.M.
In Procedia Engineering 2011 10:2190-2195
Academic Journal
Nie, X.P.; Yang, X.H.; Chen, L.Y.; Yeap, K.B.; Zeng, K.Y.; Li, D.; Pan, J.S.; Wang, X.D.; Cao, Q.P.; Ding, S.Q.; Jiang, J.Z.
In Corrosion Science 2011 53(11):3557-3565
Conference
2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :54-56 Jun, 2018
Conference
Lee, Rinus T.P.; Petrov, N.; Kassim, J.; Gribelyuk, M.; Yang, J.; Cao, L.; Yeap, K.B.; Shen, T.; Zainuddin, A. N.; Chandrashekar, A.; Ray, S.; Ramanathan, E.; Mahalingam, A. S.; Chaudhuri, R.; Mody, J.; Damjanovic, D.; Sun, Z.; Sporer, R.; Tang, T. J.; Liu, H.; Liu, J.; Krishnan, B.
2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :61-62 Jun, 2018
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(2):755-759 Feb, 2016
Conference
Narasimha, S.; Jagannathan, B.; Ogino, A.; Jaeger, D.; Greene, B.; Sheraw, C.; Zhao, K.; Haran, B.; Kwon, U.; Mahalingam, A. K. M.; Kannan, B.; Morganfeld, B.; Dechene, J.; Radens, C.; Tessier, A.; Hassan, A.; Narisetty, H.; Ahsan, I.; Aminpur, M.; An, C.; Aquilino, M.; Arya, A.; Augur, R.; Baliga, N.; Bhelkar, R.; Biery, G.; Blauberg, A.; Borjemscaia, N.; Bryant, A.; Cao, L.; Chauhan, V.; Chen, M.; Cheng, L.; Choo, J.; Christiansen, C.; Chu, T.; Cohen, B.; Coleman, R.; Conklin, D.; Crown, S.; da Silva, A.; Dechene, D.; Derderian, G.; Deshpande, S.; Dilliway, G.; Donegan, K.; Eller, M.; Fan, Y.; Fang, Q.; Gassaria, A.; Gauthier, R.; Ghosh, S.; Gifford, G.; Gordon, T.; Gribelyuk, M.; Han, G.; Han, J.H.; Han, K.; Hasan, M.; Higman, J.; Holt, J.; Hu, L.; Huang, L.; Huang, C.; Hung, T.; Jin, Y.; Johnson, J.; Johnson, S.; Joshi, V.; Joshi, M.; Justison, P.; Kalaga, S.; Kim, T.; Kim, W.; Krishnan, R.; Krishnan, B.; Anil, K.; Kumar, M.; Lee, J.; Lee, R.; Lemon, J.; Liew, S.L.; Lindo, P.; Lingalugari, M.; Lipinski, M.; Liu, P.; Liu, J.; Lucarini, S.; Ma, W.; Maciejewski, E.; Madisetti, S.; Malinowski, A.; Mehta, J.; Meng, C.; Mitra, S.; Montgomery, C.; Nayfeh, H.; Nigam, T.; Northrop, G.; Onishi, K.; Ordonio, C.; Ozbek, M.; Pal, R.; Parihar, S.; Patterson, O.; Ramanathan, E.; Ramirez, I.; Ranjan, R.; Sarad, J.; Sardesai, V.; Saudari, S.; Schiller, C.; Senapati, B.; Serrau, C.; Shah, N.; Shen, T.; Sheng, H.; Shepard, J.; Shi, Y.; Silvestre, M.C.; Singh, D.; Song, Z.; Sporre, J.; Srinivasan, P.; Sun, Z.; Sutton, A.; Sweeney, R.; Tabakman, K.; Tan, M.; Wang, X.; Woodard, E.; Xu, G.; Xu, D.; Xuan, T.; Yan, Y.; Yang, J.; Yeap, K.B.; Yu, M.; Zainuddin, A.; Zeng, J.; Zhang, K.; Zhao, M.; Zhong, Y.; Carter, R.; Lin, C.-H.; Grunow, S.; Child, C.; Lagus, M.; Fox, R.; Kaste, E.; Gomba, G.; Samavedam, S.; Agnello, P.; Sohn, D. K.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.5.1-29.5.4 Dec, 2017
Conference
2011 IEEE International Interconnect Technology Conference Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International. :1-3 May, 2011
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 38(1):119-122 Jan, 2017
Academic Journal
Liao, Z.; Gall, M.; Yeap, K.B.; Sander, C.; Clausner, A.; Muhle, U.; Gluch, J.; Standke, Y.; Rosenkranz, R.; Aubel, O.; Hauschildt, M.; Zschech, E.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 16(4):455-460 Dec, 2016
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[AR] Yeap, K.B.
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