학술논문
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Academic Journal
In: RSC Sustainability . (RSC Sustainability, 2024)
Conference
Sultan, A.; Desineni, R.; Hassmann, J.; Hoeppner, K.; Ramanathan, E.; Babcock, C.; Chua, K.P.; Teoh, E.; Dai, V.; Yeo, S.; Hui, C.; Capodieci, L.; McGowan, S.; Madge, R.
ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI. :126-129 May, 2013
Academic Journal
Wong, S.-S.; Zanin, M.; Jeevan, T.; Webby, R.J.; Oshansky, C.M.; Guo, X.-Z.J.; Thomas, P.G.; Ralston, J.; Wood, T.; Seeds, R.; Jelley, L.; Waite, B.; Huang, Q.S.; Reynolds, G.E.; Widdowson, M.-A.; Turner, N.; Baker, M.; Grant, C.; McArthur, C.; Roberts, S.; Trenholmes, A.; Wong, C.; Taylor, S.; Thompson, M.; Gross, D.; Duque, J.; Haven, K.; Aley, D.; Muponisi, P.; Chand, B.; Chen, Y.; Plewes, L.; Sawtell, F.; Lawrence, S.; Cogcoy, R.; Smith, J.; Gravidez, F.; Ma, M.; Chamberlin, S.; Davey, K.; Knowles, T.; McLeish, J.-A.; Todd, A.; Bocacao, J.; Gunn, W.; Kawakami, P.; Walker, S.; Madge, R.; Moore, N.; Rahnama, F.; Qiao, H.; Tse, F.; Zibaei, M.; Korrapadu, T.; Optland, L.; Dela Cruz, C.
In: Cell Reports Medicine . (Cell Reports Medicine, 20 April 2021, 2(4))
Conference
23rd IEEE VLSI Test Symposium (VTS'05) VLSI test symposium VLSI Test Symposium, 2005. Proceedings. 23rd IEEE. :427-432 2005
Conference
22nd IEEE VLSI Test Symposium, 2004. Proceedings. VLSI test symposium VLSI Test Symposium, 2004. Proceedings. 22nd IEEE. :185-190 2004
Conference
2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :181-189 2004
Conference
2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :203-212 2004
Conference
2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :300-308 2004
Affordable and effective screening of delay defects in ASICs using the inline resistance fault model
Conference
Benware, B.; Lu, C.; Van Slyke, J.; Prabhu Krishnamurthy; Madge, R.; Keim, M.; Kassab, M.; Rajski, J.
2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :1285-1294 2004
Conference
2003 Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in Europe Design, Automation and Test in Europe Conference and Exhibition, 2003. :402-407 2003
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[AR] Madge, R.
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