학술논문
'학술논문'
에서 검색결과 27건 | 목록
1~10
Process Innovations for Future Technology Nodes with Back-Side Power Delivery and 3D Device Stacking
Conference
Kobrinsky, M.; Silva, J. D; Mannebach, E.; Mills, S.; El Qader, M. Abd; Adebayo, O.; Radhakrishna, N. Arkali; Beasley, M.; Chawla, J.; Chugh, S.; Clinton, E.; Dasgupta, A.; Desai, U.; De Re, E.; Dewey, G.; Edwards, T.; Engel, C.; Galatage, R.; Ghani, T.; Gudmundsson, V.; Hibbeler, L.; Hicks, J.; Krist, B.; Mehandru, R.; Meric, I.; Morrow, P.; Nandi, D.; Pantuso, D.; Patel, P.; Pawashe, C.; Radosavljevic, M.; Ramamurthy, R.; Samanta, D.; Cekli, S.; Shoer, L.; Amour, A. St; Tan, L. H.; Yemenicioglu, S.; Wang, X.; Wiedemer, J. A.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Radosavljevic, Marko; Huang, C.-Y.; Galatage, R.; Qayyum, M. F.; Wiedemer, J. A.; Clinton, E.; Bennett, D.; Ryu, H.; Thomas, N. K.; Morrow, P.; Michaelos, T.; Nahm, R.; Briggs, N.; Roy, A.; Kuo, C. C.; Atanasov, S.; Ghose, S.; Zussblatt, N.; Kumar, N.; Unluer, D.; Beasley, M.; Tan, J. M.; Tan, L. H.; Elkins, M.; Cekli, S.; Hermann, R.; Shoer, L.; El Qader, M. Abd; Desai, U.; Edwards, T.; Prasad, P.; Armstrong, J.; Ghosh, M.; Liao, Y.-A.; Kapinus, V.; Dixit, D.; Harper, M. K.; Tran, P.; Cheong, K. L.; Fatehi, A.; Oni, A. A.; Franco, N.; Krist, B. J.; Metz, M. V.; Dewey, G.; Schenker, R.; Kobrinsky, M. J.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Siddiqui, S.; Galatage, R.; Zhao, W.; Muthinti, G. Raja; Fronheiser, J.; Srinivasan, P.; Triyoso, D.H.; Sporer, R.; Jagannathan, H.; Haran, B.; Knorr, A.
In Microelectronic Engineering 15 February 2020 223
Conference
Loubet, N.; Hook, T.; Montanini, P.; Yeung, C.-W.; Kanakasabapathy, S.; Guillom, M.; Yamashita, T.; Zhang, J.; Miao, X.; Wang, J.; Young, A.; Chao, R.; Kang, M.; Liu, Z.; Fan, S.; Hamieh, B.; Sieg, S.; Mignot, Y.; Xu, W.; Seo, S.-C.; Yoo, J.; Mochizuki, S.; Sankarapandian, M.; Kwon, O.; Carr, A.; Greene, A.; Park, Y.; Frougier, J.; Galatage, R.; Bao, R.; Shearer, J.; Conti, R.; Song, H.; Lee, D.; Kong, D.; Xu, Y.; Arceo, A.; Bi, Z.; Xu, P.; Muthinti, R.; Li, J.; Wong, R.; Brown, D.; Oldiges, P.; Robison, R.; Arnold, J.; Felix, N.; Skordas, S.; Gaudiello, J.; Standaert, T.; Jagannathan, H.; Corliss, D.; Na, M.-H.; Knorr, A.; Wu, T.; Gupta, D.; Lian, S.; Divakaruni, R.; Gow, T.; Labelle, C.; Lee, S.; Paruchuri, V.; Bu, H.; Khare, M.
2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T230-T231 Jun, 2017
Conference
Lee, C. H.; Kim, H.; Jamison, P.; Southwick, R. G.; Mochizuki, S.; Watanabe, K.; Bao, R.; Galatage, R.; Guillaumet, S.; Ando, T.; Pandey, R.; Konar, A.; Lherron, B.; Fronheiser, J.; Siddiqui, S.; Jagannathan, H.; Paruchuri, V.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Conference
Krivokapic, Z.; Rana, U.; Galatage, R.; Razavieh, A.; Aziz, A.; Liu, J.; Shi, J.; Kim, H. J.; Sporer, R.; Serrao, C.; Busquet, A.; Polakowski, P.; Muller, J.; Kleemeier, W.; Jacob, A.; Brown, D.; Knorr, A.; Carter, R.; Banna, S.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :15.1.1-15.1.4 Dec, 2017
Conference
Lee, C. H.; Mochizuki, S.; Southwick, R. G.; Li, J.; Miao, X.; Bao, R.; Ando, T.; Galatage, R.; Siddiqui, S.; Labelle, C.; Knorr, A.; Stathis, J. H.; Guo, D.; Narayanan, V.; Haran, B.; Jagannathan, H.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :37.2.1-37.2.4 Dec, 2017
Conference
Xie, R.; Montanini, P.; Akarvardar, K.; Tripathi, N.; Haran, B.; Johnson, S.; Hook, T.; Hamieh, B.; Corliss, D.; Wang, J.; Miao, X.; Sporre, J.; Fronheiser, J.; Loubet, N.; Sung, M.; Sieg, S.; Mochizuki, S.; Prindle, C.; Seo, S.; Greene, A.; Shearer, J.; Labonte, A.; Fan, S.; Liebmann, L.; Chao, R.; Arceo, A.; Chung, K.; Cheon, K.; Adusumilli, P.; Amanapu, H.P.; Bi, Z.; Cha, J.; Chen, H.-C.; Conti, R.; Galatage, R.; Gluschenkov, O.; Kamineni, V.; Kim, K.; Lee, C.; Lie, F.; Liu, Z.; Mehta, S.; Miller, E.; Niimi, H.; Niu, C.; Park, C.; Park, D.; Raymond, M.; Sahu, B.; Sankarapandian, M.; Siddiqui, S.; Southwick, R.; Sun, L.; Surisetty, C.; Tsai, S.; Whang, S.; Xu, P.; Xu, Y.; Yeh, C.; Zeitzoff, P.; Zhang, J.; Li, J.; Demarest, J.; Arnold, J.; Canaperi, D.; Dunn, D.; Felix, N.; Gupta, D.; Jagannathan, H.; Kanakasabapathy, S.; Kleemeier, W.; Labelle, C.; Mottura, M.; Oldiges, P.; Skordas, S.; Standaert, T.; Yamashita, T.; Colburn, M.; Na, M.; Paruchuri, V.; Lian, S.; Divakaruni, R.; Gow, T.; Lee, S.; Knorr, A.; Bu, H.; Khare, M.
2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :2.7.1-2.7.4 Dec, 2016
Academic Journal
In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics . (Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 1 March 2017, 35(2))
Academic Journal
Park, S.W.; Choi, J.Y.; Kummel, A.C.; Siddiqui, S.; Sahu, B.; Galatage, R.; Yoshida, N.; Kachian, J.
In: Journal of Chemical Physics . (Journal of Chemical Physics, 7 February 2017, 146(5))
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[AR] Galatage, R.
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