학술논문
'학술논문'
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1~10
Conference
Weber, O.; Pigot, C.; Berthelon, R.; Gandolfo, A.; Mattavelli, P.; Jasse, J.; Samanni, G.; Gomiero, E.; Richard, E.; Grenier, J. C.; Ranica, R.; Chouteau, S.; Beneyton, R.; Duclaux, B.; Beylier, C.; Pelissier, D.; Gallon, C.; Toulouse, C.; Jenny, C.; Croisy, M.; Borowiak, C.; Haendler, S.; Ogier, J.L.; Batail, E.; Gilibert, F.; Boivin, P.; Turgis, D.; Conte, A.; Disegni, F.; Redaelli, A.; Annunziata, R.; Cappelletti, P.; Piazza, F.; Ferreira, P.; Arnaud, F.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Niel, S.; Rosa, F. La; Regnier, A.; Mantelli, M.; Trenteseaux, F.; Ghezzi, G.; Marzaki, A.; Hubert, Q.; Delalleau, J.; Cabout, T.; Maugain, F.; Lepape, E.; Baron, L.; Champenois, A.; Galpin, D.; Cherault, N.; Audran, S.; Parmigiani, L.; Gouraud, P.; Duclaux, B.; Escarabajal, Y.; Baudin, F.; Beche, E.; Saidi, B.; Arnal, V.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :7.4.1-7.4.4 Dec, 2018
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
Conference
Duclaux, B.; Pelletier, A.; De-Caunes, J.; Perrier, R.; Babaud, L.; Gatefait, M.; Fagart, O.; Thivolle, N.; Guerabsi, M.; Chapon, J.-D.; Perrin, B.; Monget, C.
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2019. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, May 2019, 2019-May)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2018, 10585)
Academic Journal
In: Pédiatrie . (Pédiatrie, 1988, 43(9):763-767)
Academic Journal
In: Annales Medico-Psychologiques . (Annales Medico-Psychologiques, May 1972, 1(5):609-624)
Conference
Chen, S.-T.; Lafferty, N.; Koay, C.-S.; Saulnier, N.; Xu, Y.; Beard, M.; Yin, Y.; Shobha, H.; Van Der Straten, O.; Kelly, J.; Colburn, M.; Spooner, T.; Kim, T.-S.; Nam, S.-W.; Wang, W.; He, M.; Duclaux, B.; Mignot, Y.
In: Proceedings of the 2013 IEEE International Interconnect Technology Conference, IITC 2013 , Proceedings of the 2013 IEEE International Interconnect Technology Conference, IITC 2013. (Proceedings of the 2013 IEEE International Interconnect Technology Conference, IITC 2013, 2013)
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[AR] Duclaux, B.
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