학술논문
'학술논문'
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1~10
Academic Journal
Guillan, J.; Haxaire, K.; Chhun, S.; Richard, E.; Luche, M.C.; Arnaud, L.; Petitprez, E.; Monget, C.; Galpin, D.; Normandon, P.
In Microelectronic Engineering 2011 88(5):697-700
Academic Journal
Hamioud, K.; Arnal, V.; Farcy, A.; Jousseaume, V.; Zenasni, A.; Icard, B.; Pradelles, J.; Manakli, S.; Brun, Ph.; Imbert, G.; Jayet, C.; Assous, M.; Maitrejean, S.; Galpin, D.; Monget, C.; Guillan, J.; Chhun, S.; Richard, E.; Barbier, D.; Haond, M.
In Microelectronic Engineering 2010 87(3):316-320
Academic Journal
In Microelectronic Engineering 2010 87(3):355-360
Conference
Fox, R.; Hinsinger, O.; Richard, E.; Sabouret, E.; Berger, T.; Goldberg, C.; Humbert, A.; Imbert, G.; Brun, P.; Ollier, E.; Maurice, C.; Guillermet, M.; Monget, C.; Plantier, V.; Bono, H.; Zaleski, M.; Mellier, M.; Jacquemin, J.-P.; Flake, J.; Sharma, B.G.; Broussous, L.; Farcy, A.; Arnal, V.; Gonella, R.; Maubert, S.; Girault, V.; Vannier, P.; Reber, D.; Schussler, A.; Mueller, J.; Besling, W.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :81-84 2005
Conference
Hinsinger, O.; Fox, R.; Sabouret, E.; Goldberg, C.; Verove, C.; Besling, W.; Brun, P.; Josse, E.; Monget, C.; Belmont, O.; Van Hassel, J.; Sharma, B.G.; Jacquemin, J.P.; Vannier, P.; Humbert, A.; Bunel, D.; Gonella, R.; Mastromatteo, E.; Reber, D.; Farcy, A.; Mueller, J.; Christie, P.; Nguyen, V.H.; Cregut, C.; Berger, T.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :317-320 2004
Conference
Weber, O.; Josse, E.; Andrieu, F.; Cros, A.; Richard, E.; Perreau, P.; Baylac, E.; Degors, N.; Gallon, C.; Perrin, E.; Chhun, S.; Petitprez, E.; Delmedico, S.; Simon, J.; Druais, G.; Lasserre, S.; Mazurier, J.; Guillot, N.; Bernard, E.; Bianchini, R.; Parmigiani, L.; Gerard, X.; Pribat, C.; Gourhant, O.; Abbate, F.; Gaumer, C.; Beugin, V.; Gouraud, P.; Maury, P.; Lagrasta, S.; Barge, D.; Loubet, N.; Beneyton, R.; Benoit, D.; Zoll, S.; Chapon, J.-D.; Babaud, L.; Bidaud, M.; Gregoire, M.; Monget, C.; Le-Gratiet, B.; Brun, P.; Mellier, M.; Pofelski, A.; Clement, L.R.; Bingert, R.; Puget, S.; Kruck, J.-F.; Hoguet, D.; Scheer, P.; Poiroux, T.; Manceau, J.-P.; Rafik, M.; Rideau, D.; Jaud, M.-A.; Lacord, J.; Monsieur, F.; Grenouillet, L.; Vinet, M.; Liu, Q.; Doris, B.; Celik, M.; Fetterolf, S.P.; Faynot, O.; Haond, M.
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 9(2):120-127 Jun, 2009
Conference
Vilmay, M.; Roy, D.; Besset, C.; Galpin, D.; Monget, C.; Vannier, P.; Le Friec, Y.; Imbert, G.; Mellier, M.; Petitdidier, S.; Robin, O.; Guillan, J.; Chhun, S.; Arnaud, L.; Volpi, F.; Chaix, J.-M.
2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :122-124 Jun, 2009
Conference
Hamioud, K.; Arnal, V.; Farcy, A.; Jousseaume, V.; Zenasni, A.; Gourhant, O.; Icard, B.; Pradelles, J.; Manakli, S.; Brun, Ph.; Imbert, G.; Jayet, C.; Assous, M.; Maitrejean, S.; Vilmay, M.; Galpin, D.; Monget, C.; Guillan, J.; Chhun, S.; Richard, E.; Barbier, D.; Haond, M.
2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :155-156 Jun, 2009
Conference
Arnaud, L.; Galpin, D.; Chhun, S.; Monget, C.; Richard, E.; Roy, D.; Besset, C.; Vilmay, M.; Doyen, L.; Waltz, P.; Petitprez, E.; Terrier, F.; Imbert, G; Le Friec, Y
2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :179-181 Jun, 2009
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[AR] Monget, C.
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