학술논문
'학술논문'
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1~10
Conference
Ranica, R.; Berthelon, R.; Gandolfo, A.; Samanni, G.; Gomiero, E.; Jasse, J.; Mattavelli, P.; Sandrini, J.; Querre, M.; Le-Friec, Y.; Poulet, J.; Caubet, V.; Favennec, L.; Boccaccio, C.; Ghezzi, G.; Gallon, C.; Grenier, JC.; Dumont, B.; Weber, O.; Villaret, A.; Beneyton, R.; Cherault, N.; Ristoiu, D.; Del Medico, S.; Kermarrec, O.; Reynard, JP.; Boivin, P.; Souhaite, A.; Desvoivres, L.; Chouteau, S.; Sassoulas, PO.; Clement, L.; Valery, A.; Petroni, E.; Turgis, D.; Lippiello, A.; Scotti, L.; Disegni, F.; Ventre, A.; Ornaghi, D.; De Tomasi, M.; Maurelli, A.; Conte, A.; Arnaud, F.; Redaelli, A.; Annunziata, R.; Cappelletti, P.; Piazza, F.; Ferreira, P.; Gonella, R.; Ciantar, E.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :28.1.1-28.1.4 Dec, 2021
High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
Conference
Arnaud, F.; Ferreira, P.; Piazza, F.; Gandolfo, A.; Zuliani, P.; Mattavelli, P.; Gomiero, E.; Samanni, G.; Jasse, J.; Jahan, C.; Reynard, J. P.; Berthelon, R.; Weber, O.; Villaret, A.; Dumont, B.; Grenier, J. C.; Ranica, R.; Gallon, C.; Boccaccio, C.; Souhaite, A.; Desvoivres, L.; Ristoiu, D.; Favennec, L.; Caubet, V.; Delmedico, S.; Cherault, N.; Beneyton, R.; Chouteau, S.; Sassoulas, P. O.; Clement, L.; Boivin, P.; Turgis, D.; Disegni, F.; Ogier, J. L.; Federspiel, X.; Kermarrec, O.; Molgg, M.; Viscuso, A.; Annunziata, R.; Maurelli, A.; Cappelletti, P.; Ciantar, E.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :24.2.1-24.2.4 Dec, 2020
Academic Journal
In Thin Solid Films 22 December 2005 493(1-2):175-178
Academic Journal
In Microelectronic Engineering 2005 82(3):368-373
Conference
Niel, S.; Rosa, F. La; Regnier, A.; Mantelli, M.; Trenteseaux, F.; Ghezzi, G.; Marzaki, A.; Hubert, Q.; Delalleau, J.; Cabout, T.; Maugain, F.; Lepape, E.; Baron, L.; Champenois, A.; Galpin, D.; Cherault, N.; Audran, S.; Parmigiani, L.; Gouraud, P.; Duclaux, B.; Escarabajal, Y.; Baudin, F.; Beche, E.; Saidi, B.; Arnal, V.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :7.4.1-7.4.4 Dec, 2018
Conference
Arnaud, F.; Zuliani, P.; Reynard, J.P.; Gandolfo, A.; Disegni, F.; Mattavelli, P.; Gomiero, E.; Samanni, G.; Jahan, C.; Berthelon, R.; Weber, O.; Richard, E.; Barral, V.; Villaret, A.; Kohler, S.; Grenier, J.C.; Ranica, R.; Gallon, C.; Souhaite, A.; Ristoiu, D.; Favennec, L.; Caubet, V.; Delmedico, S.; Cherault, N.; Beneyton, R.; Chouteau, S.; Sassoulas, P.O.; Vernhet, A.; Le Friec, Y.; Domengie, F.; Scotti, L.; Pacelli, D.; Ogier, J.L.; Boucard, F.; Lagrasta, S.; Benoit, D.; Clement, L.; Boivin, P.; Ferreira, P.; Annunziata, R.; Cappelletti, P.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :18.4.1-18.4.4 Dec, 2018
Conference
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :493-496 2005
Conference
Carrere, J-P; Larman, F.; van der Vegt, E.; Bocat, M.; Auriac, N.; Cherault, N.; Charleux, M.; Rochereau, K.; Hopstaken, M.; Pantel, R.; Boter, D.; Dormans, D.
ESSDERC 2007 - 37th European Solid State Device Research Conference Solid State Device Research Conference, 2007. ESSDERC 2007. 37th European. :263-266 Sep, 2007
Academic Journal
Roy, F.; Tournier, A.; Wehbe-Alause, H.; Blanchet, F.; Boulenc, P.; Leverd, F.; Favennec, L.; Perrot, C.; Pinzelli, L.; Gatefait, M.; Cherault, N.; Jeanjean, D.; Carrere, J.P.; Augier, C.; Ricq, S.; Herault, D.; Hulot, S.
In: Physica Status Solidi (C) Current Topics in Solid State Physics . (Physica Status Solidi (C) Current Topics in Solid State Physics, January 2014, 11(1):50-56)
Conference
Morillon, D.; Julien, F.; Goy, J.; Pribat, C.; Gourhant, O.; Kempf, T.; Ogier, J.-L.; Villaret, A.; Ghezzi, G.; Cherault, N.; Niel, S.; Masson, P.; Lorenzini, P.
In: IEEE International Integrated Reliability Workshop Final Report , 2018 IEEE International Integrated Reliability Workshop, IIRW 2018. (IEEE International Integrated Reliability Workshop Final Report, October 2018, 2018-October)
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[AR] Cherault, N.
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