학술논문
'학술논문'
에서 검색결과 152건 | 목록
20~30
Academic Journal
Le-Gratiet, B.; De-Caunes, J.; Gatefait, M.; Lam, A.; Ostrovsky, A.; Planchot, J.; Farys, V.; Ducoté, J.; Mikolajczak, M.; Morin, V.; Chojnowski, N.; Sundermann, F.; Pelletier, A.; Bouyssou, R.; Monget, C.; Chapon, J.D.; Orlando, B.; Babaud, L.; Yesilada, E.; Szucs, A.; Michel, J.-C.; Bengoechea, O.R.; Gouraud, P.; Lapeyre, C.; Desvoivres, L.
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 1 April 2015, 14(2))
Conference
Le Gratiet, B.; Bouyssou, R.; Ducoté, J.; Ostrovsky, A.; Audran, S.; Gardin, C.; Schuch, N.G.; Valade, C.; Belissard, J.; Millequant, M.; Figueiro, T.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Academic Journal
In: Physics in Medicine and Biology . (Physics in Medicine and Biology, 6 January 2014, 59(1):135-152)
Conference
Le-Gratiet, B.; Bouyssou, R.; Ducoté, J.; Ostrovsky, A.; Beylier, C.; Gardin, C.; Schuch, N.; Annezo, V.; Schneider, L.; Millequant, M.; Petroni, P.; Figueiro, T.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
Academic Journal
In: Journal of Zoo and Wildlife Medicine . (Journal of Zoo and Wildlife Medicine, 2010, 41(1):90-94)
Academic Journal
34 Loy. L. Rev. 608 (1988-1989) / Loyola Law Review, Vol. 34, Issue 3 (Fall 1988), pp. 608-620
Academic Journal
In: Medical Physics . (Medical Physics, 2008, 35(4):1428-1439)
Conference
Le Gratiet, B.; Bouyssou, R.; Ducoté, J.; Dezauzier, C.; Ostrovsky, A.; Beylier, C.; Gardin, C.; Petroni, P.; Milléquant, M.; Chagoya-Garzon, A.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 10959)
Academic Journal
In: Skin Pharmacology and Physiology . (Skin Pharmacology and Physiology, 1 January 1997, 10(2):71-78)
검색 결과 제한하기
제한된 항목
[검색어] Ducotè, J.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어