학술논문
'학술논문'
에서 검색결과 23건 | 목록
1~10
Academic Journal
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 2 July 2015, 14(3))
Conference
Pradelles, J.; Perraud, L.; Fay, A.; Henry, J.-B.; Bustos, J.; Guyez, E.; Berard-Bergery, S.; Le Pennec, A.; Sezestre, E.; Abaidi, M.; Belissard, J.; Schuch, N.; Millequant, M.; Figueiro, T.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Le Gratiet, B.; Bouyssou, R.; Ducoté, J.; Ostrovsky, A.; Audran, S.; Gardin, C.; Schuch, N.G.; Valade, C.; Belissard, J.; Millequant, M.; Figueiro, T.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Abaidi, M.; Belissard, J.; Schuch, N.; Figueiro, T.; Millequant, M.; Schiavone, P.; Pradelles, J.; Perraud, L.; Fay, A.; Bustos, J.; Henry, J.-B.; Guyez, E.; Berard-Bergery, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Academic Journal
Brandt, P.; Wieland, M.; Belledent, J.; Meunier, S.; Fay, A.; Icard, B.; Tranquillin, C.; Figueiro, T.; Bayle, S.; Milléquant, M.
In: Journal of Micro/Nanolithography, MEMS, and MOEMS . (Journal of Micro/Nanolithography, MEMS, and MOEMS, July 2014, 13(3))
Conference
Le-Gratiet, B.; Bouyssou, R.; Ducoté, J.; Ostrovsky, A.; Beylier, C.; Gardin, C.; Schuch, N.; Annezo, V.; Schneider, L.; Millequant, M.; Petroni, P.; Figueiro, T.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
Academic Journal
In: Macromolecular Chemistry and Physics . (Macromolecular Chemistry and Physics, 1 April 2010, 211(7):736-743)
Academic Journal
In: Macromolecules . (Macromolecules, 3 October 2006, 39(20):6905-6912)
Academic Journal
Sudor, J.; Barbier, V.; Thirot, S.; Godfrin, D.; Hourdet, D.; Millequant, M.; Blanchard, J.; Viovy, J.-L.
In: Electrophoresis . (Electrophoresis, 2001, 22(4):720-728)
Conference
Le Gratiet, B.; Bouyssou, R.; Ducoté, J.; Dezauzier, C.; Ostrovsky, A.; Beylier, C.; Gardin, C.; Petroni, P.; Milléquant, M.; Chagoya-Garzon, A.; Schiavone, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 10959)
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제한된 항목
[AR] Millequant, M.
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