학술논문
'학술논문'
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Academic Journal
Choisnet, T.; Hammouti, A.; Gagneur, V.; Ducote, J.; Le Cunff, D.; Reche, J.; Rademaker, G.; Freychet, G.; Jullien, G.; Gergaud, P.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 January 2024, 23(1))
Academic Journal
Fenouillet-Beranger, C.; Perreau, P.; Benoist, T.; Richier, C.; Haendler, S.; Pradelle, J.; Bustos, J.; Brun, P.; Tosti, L.; Weber, O.; Andrieu, F.; Orlando, B.; Pellissier-Tanon, D.; Abbate, F.; Richard, C.; Beneyton, R.; Gregoire, M.; Ducote, J.; Gouraud, P.; Margain, A.; Borowiak, C.; Bianchini, R.; Planes, N.; Gourvest, E.; Bourdelle, K.K.; Nguyen, B.Y.; Poiroux, T.; Skotnicki, T.; Faynot, O.; Boeuf, F.
In Solid State Electronics October 2013 88:15-20
Academic Journal
In Nuclear Physics, Section A 2005 754:272-280
Conference
Fenouillet-Beranger, C.; Perreau, P.; Benoist, T.; Richier, C.; Haendler, S.; Pradelle, J.; Bustos, J.; Brun, P.; Tosti, L.; Weber, O.; Andrieu, F.; Orlando, B.; Pellissier-Tanon, D.; Abbate, F.; Pvichard, C.; Beneyton, R.; Gregoire, M.; Ducote, J.; Gouraud, P.; Margain, A.; Borowiak, C.; Bianchini, R.; Planes, N.; Gourvest, E.; Bourdelle, K. K.; Nguyen, B. Y.; Poiroux, T.; Skotnicki, T.; Faynot, O.; Boeuf, F.
2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :165-168 Mar, 2012
Conference
Chevolleau, T.; Posseme, N.; David, T.; Bouyssou, R.; Ducote, J.; Bailly, F.; Darnon, M.; Kodadi, M. El; Besacier, M.; Licitra, C.; Guillermet, M.; Ostrovsky, A.; Verove, C.; Joubert, O.
2010 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2010 International. :1-3 Jun, 2010
Conference
Choisnet, T.; Hammouti, A.; Gagneur, V.; Ducote, J.; Le Cunff, D.; Reche, J.; Rademaker, G.; Freychet, G.; Jullien, G.; Gergaud, P.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12496)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical and EUV Nanolithography XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12494)
Academic Journal
In International Journal of Radiation Oncology, Biology, Physics 1 September 2014 90(1) Supplement:S867-S867
Academic Journal
Bailly, F.; David, T.; Chevolleau, T.; Darnon, M.; Posseme, N.; Bouyssou, R.; Ducote, J.; Joubert, O.; Cardinaud, C.
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제한된 항목
[AR] Ducoté, J.
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