학술논문
'학술논문'
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180~190
Conference
Batude, P.; Fenouillet-Beranger, C.; Pasini, L.; Lu, V.; Deprat, F.; Brunet, L.; Sklenard, B.; Piegas-Luce, F.; Casse, M.; Mathieu, B.; Billoint, O.; Cibrario, G.; Turkyilmaz, O.; Sarhan, H.; Thuries, S.; Hutin, L.; Sollier, S.; Widiez, J.; Hortemel, L.; Tabone, C.; Samson, M.-P.; Previtali, B.; Rambal, N.; Ponthenier, F.; Mazurier, J.; Rozeau, O.; Euvard-Colnat, C.; Seignard, A.; Fournel, F.; Benaissa, L.; Leduc, P.; Hartmann, J.-M.; Kerdiles, S.; Bout, C.; Nemouchi, F.; Royer, A.; Agraffeil, C.; Signamarcheix, T.; Clermidy, F.; Faynot, O.; Vinet, M.; Beneyton, R.; Bidaud, M.; Josse, E.; Petitprez, E.; Rivoire, M.; Coudrain, P.; Besson, P.; Haond, M.; Ghibaudo, G.
In: Digest of Technical Papers - Symposium on VLSI Technology , 2015 Symposium on VLSI Technology, VLSI Technology 2015 - Digest of Technical Papers. (Digest of Technical Papers - Symposium on VLSI Technology, 25 August 2015, 2015-August:T48-T49)
Conference
Josse, E.; Chhun, S.; Maury, P.; Lagrasta, S.; Barge, D.; Haond, M.; Weber, O.; Mazurier, J.; Degors, N.; Manceau, J.-P.
In: Digest of Technical Papers - Symposium on VLSI Technology , 2015 Symposium on VLSI Technology, VLSI Technology 2015 - Digest of Technical Papers. (Digest of Technical Papers - Symposium on VLSI Technology, 25 August 2015, 2015-August:T168-T169)
Conference
In: 2015 International Conference on IC Design and Technology, ICICDT 2015 , 2015 International Conference on IC Design and Technology, ICICDT 2015. (2015 International Conference on IC Design and Technology, ICICDT 2015, 23 July 2015)
EP-2108 Varian and Elekta quality assurance using artificial neural network based on portal imaging.
Academic Journal
Academic Journal
Cellular and Molecular Life Sciences (CMLS). Nov, 2005, Vol. 62 Issue 21, p2549.
Academic Journal
Mazurier, J.; Marre, D.; Mathy, N.; Zarate, D.; Camilleri, J.; Gallocher, O.; Jimenez, G.; Pinel, B.; Chevelle, C.; Franck, D; Latorzeff, I.
Physica Medica; 2018:Supplement 1, Vol. 56, p8-8, 1p
Academic Journal
Conference
Denis, Y.; Monsieur, F.; Mazurier, J.; Josse, E.; Rideau, D.; Charbuillet, C.; Tavernier, C.; Jaouen, H.; Ghibaudo, G.
In: IEEE International Conference on Microelectronic Test Structures , ICMTS 2015 - Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures. (IEEE International Conference on Microelectronic Test Structures, 12 May 2015, 2015-May:59-64)
Conference
Benoit, D.; Chhun, S.; Lagrasta, S.; Gaumer, C.; Galpin, D.; Vo-Thanh, D.; Barge, D.; Duru, R.; Beneyton, R.; Hinsinger, O.; Mazurier, J.; Fenouillet-Beranger, C.; Varadarajan, B.; Gong, B.; Winandy, D.; Van Schravendijk, B.; Sun, N.; Chauvet, N.; Ruault, P.; Meijer, P.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2015 IEEE International Electron Devices Meeting, IEDM 2015. (Technical Digest - International Electron Devices Meeting, IEDM, 16 February 2015, 2016-February:8.6.1-8.6.4)
Conference
Josse, E.; Cros, A.; Richard, E.; Baylac, E.; Gallon, C.; Perrin, E.; Chhun, S.; Petitprez, E.; Delmedico, S.; Druais, G.; Guillot, N.; Bernard, E.; Bianchini, R.; Parmigiani, L.; Gerard, X.; Pribat, C.; Gourhant, O.; Abbate, F.; Gaumer, C.; Gouraud, P.; Maury, P.; Lagrasta, S.; Barge, D.; Loubet, N.; Beneyton, R.; Benoit, D.; Zoll, S.; Chapon, J.-D.; Babaud, L.; Bidaud, M.; Gregoire, M.; Monget, C.; Le-Gratiet, B.; Mellier, M.; Pofelski, A.; Clement, L.R.; Bingert, R.; Puget, S.; Kruck, J.-F.; Hoguet, D.; Scheer, P.; Rafik, M.; Rideau, D.; Lacord, J.; Monsieur, F.; Liu, Q.; Celik, M.; Haon, M.; Weber, O.; Andrieu, F.; Perreau, P.; Mazurier, J.; Beugin, V.; Brun, P.; Poiroux, T.; Jaud, M.-A.; Grenouillet, L.; Vinet, M.; Faynot, O.; Degors, N.; Simon, J.; Lasserre, S.; Manceau, J.-P.; Doris, B.; Fetterolf, S.P.
In: Digest of Technical Papers - Symposium on VLSI Technology . (Digest of Technical Papers - Symposium on VLSI Technology, 8 September 2014)
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[AR] Mazurier, J.
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