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Academic Journal
In Icarus April 2023 394
Conference
Mota-Frutuoso, T.; Lapras, V.; Brunet, L.; Basset, L.; Lugo, J.; Fenouillet-Beranger, C.; Vinet, M.; Lattard, D.; Boulard, F.; Exbraya, Y.; Boutry, D.; Billoint, O.; Bosch, D.; Maneglia, Y.; Peizerat, A.; Dumas, S.; Sicard, G.; Kerdiles, S.; Kanyandekwe, J.; Sideris, P.; Mazzocchi, V.; Sarrazin, A.; Loup, V.; Mauguen, G.; Morales, C.; Alba, P. Acosta; Balan, V.; Perrot, C.; Sturm, J.; Euvrard, C.; Aussenac, F.; Janaud, A.; Chapon, J-D.; Guillermet, M.; Guglieri, S.; Bailly, F.; Toresani, P.; Fournel, F.; Mouhdach, M.; Berthoud, A.; Chapelon, L-L.; Ribotta, M.; Ponthenier, F.; Magalhaes, A.; Maitrejean, S.; Moulin, C.; Michailos, J.; Arnaud, F.; Cathelin, A.; Arcamone, J.; Andrieu, F.; Garros, X.; Gaillard, F.; Batude., P.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Danouchi, K.; Soumah, L.; Bouchard, C.; Disdier, F.; Fassatoui, A.; Phan, N.-T.; Ezzadeen, M.; Delaet, B.; Viala, B.; Prenat, G.; Anghel, L.; Talatchian, P.; Prejbeanu, I. -L.; Andrieu, F.; Garello, K.; Hutin, L.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Bourgeois, G.; Meli, V.; Al Mamun, F.; Mazen, F.; Nolot, E.; Martinez, E.; Barnes, J.-P.; Bernier, N.; Jannaud, A.; Laulagnet, F.; Hemard, B.; Castellani, N.; Bernard, M.; Sabbione, C.; Milesi, F.; Magis, T.; Socquet-Clerc, C.; Coig, M.; Garrione, J.; Cyrille, M.-C.; Charpin, C.; Navarro, G.; Andrieu, F.
In Microelectronics Reliability November 2021 126
Convolution neural network inference using frequency modulation in computational phase-change memory
Conference
Trabelsi, A.; Cagli, C.; Hirtzlin, T.; Martin, S.; Billoint, O.; Vianello, E.; Sousa, V.; Bourgeois, G.; Andrieu, F.
2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-4 Oct, 2023
Conference
Dubreuil, T.; Barraud, S.; Pedini, J.-M.; Hartmann, J.-M.; Boulard, F.; Sarrazin, A.; Gharbi, A.; Sturm, J.; Lambert, A.; Martin, S.; Castellani, N.; Anotta, A.; Magalhaes-Lucas, A.; Souhaite, A.; Andrieu, F.
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :117-120 Sep, 2023
Academic Journal
Barbot, J.; Fontanini, R.; Segatto, M.; Coignus, J.; Triozon, F.; Carabasse, C.; Bedjaoui, M.; Andrieu, F.; Esseni, D.; Grenouillet, L.
Academic Journal
Bosch, D.; Garros, X.; Makosiej, A.; Ciampolini, L.; Weber, O.; Lacord, J.; Cluzel, J.; Giraud, B.; Berthelon, R.; Cibrario, G.; Brunet, L.; Batude, P.; Fenouillet-Béranger, C.; Lattard, D.; Colinge, J.P.; Balestra, F.; Andrieu, F.
In Solid State Electronics June 2020 168
Conference
Laguerre, J.; Bocquet, M.; Billoint, O.; Martin, S.; Coignus, J.; Carabasse, C.; Magis, T.; Dewolf, T.; Andrieu, F.; Grenouillet, L.
2023 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2023 IEEE International. :1-4 May, 2023
Conference
Reganaz, L.; Deleruyelle, D.; Rafhay, Q.; Minguet Lopez, J.; Castellani, N.; Nodin, J. F.; Bricalli, A.; Piccolboni, G.; Molas, G.; Andrieu, F.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
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제한된 항목
[AR] Andrieu, F.
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