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Academic Journal
Asenov, A.; Cathignol, A.; Cheng, B.; McKenna, K. P.; Brown, A. R.; Shluger, A. L.; Chanemougame, D.; Rochereau, K.; Ghibaudo, G.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(8):913-915 Aug, 2008
Conference
Steckel, J. S.; Josse, E.; Pattantyus-Abraham, A. G.; Bidaud, M.; Mortini, B.; Bilgen, H.; Arnaud, O.; Allegret-Maret, S.; Saguin, F.; Mazet, L.; Lhostis, S.; Berger, T.; Haxaire, K.; Chapelon, L. L.; Parmigiani, L.; Gouraud, P.; Brihoum, M.; Bar, P.; Guillermet, M.; Favreau, S.; Duru, R.; Fantuz, J.; Ricq, S.; Ney, D.; Hammad, I.; Roy, D.; Arnaud, A.; Vianne, B.; Nayak, G.; Virollet, N.; Farys, V.; Malinge, P.; Tournier, A.; Lalanne, F.; Crocherie, A.; Galvier, J.; Rabary, S.; Noblanc, O.; Wehbe-Alause, H.; Acharya, S.; Singh, A.; Meitzner, J.; Aher, D.; Yang, H.; Romero, J.; Chen, B.; Hsu, C.; Cheng, K. C.; Chang, Y.; Sarmiento, M.; Grange, C.; Mazaleyrat, E.; Rochereau, K.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :23.4.1-23.4.4 Dec, 2021
Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N -MOSFET
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(6):609-611 Jun, 2008
Conference
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Saboure, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Bienacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouille, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :423-426 2005
Conference
Duriez, B.; Tavel, B.; Boeuf, R.; Basso, M.T.; Laplanche, Y.; Ortolland, C.; Reber, D.; Wacquant, R.; Morin, P.; Lenoble, D.; Palla, R.; Bidaud, M.; Barge, D.; Dachs, C.; Brut, H.; Roy, D.; Marin, M.; Payet, F.; Cagnat, N.; Difrenza, R.; Rochereau, K.; Denais, M.; Stolk, P.; Woo, M.; Arnaud, F.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :847-850 2004
Conference
Jullien, A.; Albert, O.; Etchepare, J.; Auge-Rochereau, F.; Chambaret, J.P.; Cheriaux, G.; Falcoz, F.; Minkovski, N.; Saltiel, S.M.
2005 Quantum Electronics and Laser Science Conference Quantum Electronics and Laser Science Quantum Electronics and Laser Science Conference, 2005. QELS '05. 3:2015-2017 vol. 3 2005
Review
Bulletin de la Société de l'Histoire du Protestantisme Français (1903-), 1975 Jan 01. 121, 130-131.
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[검색어] Rochereau, N.
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