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발행년	- (예 : 2010-2015)

전체선택

$1.62\mu \mathrm{m}$ Global Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared

Conference

Steckel, J. S.; Josse, E.; Pattantyus-Abraham, A. G.; Bidaud, M.; Mortini, B.; Bilgen, H.; Arnaud, O.; Allegret-Maret, S.; Saguin, F.; Mazet, L.; Lhostis, S.; Berger, T.; Haxaire, K.; Chapelon, L. L.; Parmigiani, L.; Gouraud, P.; Brihoum, M.; Bar, P.; Guillermet, M.; Favreau, S.; Duru, R.; Fantuz, J.; Ricq, S.; Ney, D.; Hammad, I.; Roy, D.; Arnaud, A.; Vianne, B.; Nayak, G.; Virollet, N.; Farys, V.; Malinge, P.; Tournier, A.; Lalanne, F.; Crocherie, A.; Galvier, J.; Rabary, S.; Noblanc, O.; Wehbe-Alause, H.; Acharya, S.; Singh, A.; Meitzner, J.; Aher, D.; Yang, H.; Romero, J.; Chen, B.; Hsu, C.; Cheng, K. C.; Chang, Y.; Sarmiento, M.; Grange, C.; Mazaleyrat, E.; Rochereau, K.

2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :23.4.1-23.4.4 Dec, 2021

Full Text (IEEE) Find it@PNU

MOS Capacitor Deep Trench Isolation for CMOS image sensors

Conference

Ahmed, N.; Roy, F.; Lu, G-N.; Mamdy, B.; Carrere, J-P.; Tournier, A.; Virollet, N.; Perrot, C.; Rivoire, M.; Seignard, A.; Pellissier-Tanon, D.; Leverd, F.; Orlando, B.

2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :4.1.1-4.1.4 Dec, 2014

Full Text (IEEE) Find it@PNU

A 750 K photocharge linear full well in a 3.2 µm HDR pixel with complementary carrier collection

Academic Journal

Lalanne, F.; Malinge, P.; Hérault, D.; Jamin-Mornet, C.; Virollet, N.

In: Sensors (Switzerland). (Sensors (Switzerland), 20 January 2018, 18(1))

EBSCOHost PDF Full Text (ProQuest Central) Web of Science JCR 저널정보 Scopus Find it@PNU

1.62 µglobal Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared

Conference

Steckel, J.S.; Bar, P.; Grange, C.; Mazaleyrat, E.; Rochereau, K.; Josse, E.; Bidaud, M.; Mortini, B.; Bilgen, H.; Arnaud, O.; Allegret-Maret, S.; Saguin, F.; Mazet, L.; Lhostis, S.; Berger, T.; Haxaire, K.; Chapelon, L.L.; Parmigiani, L.; Gouraud, P.; Brihoum, M.; Guillermet, M.; Favreau, S.; Duru, R.; Fantuz, J.; Ricq, S.; Ney, D.; Hammad, I.; Roy, D.; Arnaud, A.; Vianne, B.; Nayak, G.; Virollet, N.; Farys, V.; Malinge, P.; Tournier, A.; Lalanne, F.; Crocherie, A.; Galvier, J.; Rabary, S.; Noblanc, O.; Wehbe-Alause, H.; Pattantyus-Abraham, A.G.; Acharya, S.; Singh, A.; Meitzner, J.; Aher, D.; Yang, H.; Romero, J.; Chen, B.; Sarmiento, M.; Hsu, C.; Cheng, K.C.; Chang, Y.

In: Technical Digest - International Electron Devices Meeting, IEDM, 2021 IEEE International Electron Devices Meeting, IEDM 2021. (Technical Digest - International Electron Devices Meeting, IEDM, 2021, 2021-December:23.4.1-23.4.4)

Full Text (IEEE) Scopus Find it@PNU

MOS Capacitor Deep Trench Isolation for CMOS image sensors

Conference

Ahmed, N.; Roy, F.; Mamdy, B.; Carrere, J.-P.; Tournier, A.; Virollet, N.; Perrot, C.; Rivoire, M.; Pellissier-Tanon, D.; Leverd, F.; Orlando, B.; Lu, G.-N.; Seignard, A.

In: Technical Digest - International Electron Devices Meeting, IEDM, 2014 IEEE International Electron Devices Meeting, IEDM 2014. (Technical Digest - International Electron Devices Meeting, IEDM, 20 February 2015, 2015-February(February):4.1.1-4.1.4)

Full Text (IEEE) Scopus Find it@PNU

An Image Quality Evaluation Tool simulating image sensors including Quantum Efficiency off-axis effect

Conference

Mornet, C.; Vaillant, J.; Decroux, T.; Virollet, N.; Herault, D.; Schanen, I.

In: Proceedings of SPIE - The International Society for Optical Engineering, Proceedings of SPIE-IS and T Electronic Imaging - Digital Photography VII. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 7876)

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Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shift

Conference

Vaillant, J.; Decroux, T.; Huss, E.; Barbier, F.; Hérault, D.; Hirigoyen, F.; Virollet, N.

In: Proceedings of SPIE - The International Society for Optical Engineering, Proceedings of SPIE-IS and T Electronic Imaging - Digital Photography IV. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6817)

Scopus Find it@PNU

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