학술논문
'학술논문'
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Conference
Malinge, P.; Lalanne, F.; Herault, D.; Ferrotti, T.; Simony, L.; Bigault, S.; Favreau, J.; Nassiet, T.; Sacchettini, Y.; Augier, C.; Ricq, S.; Waltz, P.; Brun, F.; Roux, N.; Glais, A.; Roffet, G.; Chua, L.; Duey, J.R.; Tournier, A.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(6):2835-2840 Jun, 2021
Conference
Steckel, J. S.; Josse, E.; Pattantyus-Abraham, A. G.; Bidaud, M.; Mortini, B.; Bilgen, H.; Arnaud, O.; Allegret-Maret, S.; Saguin, F.; Mazet, L.; Lhostis, S.; Berger, T.; Haxaire, K.; Chapelon, L. L.; Parmigiani, L.; Gouraud, P.; Brihoum, M.; Bar, P.; Guillermet, M.; Favreau, S.; Duru, R.; Fantuz, J.; Ricq, S.; Ney, D.; Hammad, I.; Roy, D.; Arnaud, A.; Vianne, B.; Nayak, G.; Virollet, N.; Farys, V.; Malinge, P.; Tournier, A.; Lalanne, F.; Crocherie, A.; Galvier, J.; Rabary, S.; Noblanc, O.; Wehbe-Alause, H.; Acharya, S.; Singh, A.; Meitzner, J.; Aher, D.; Yang, H.; Romero, J.; Chen, B.; Hsu, C.; Cheng, K. C.; Chang, Y.; Sarmiento, M.; Grange, C.; Mazaleyrat, E.; Rochereau, K.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :23.4.1-23.4.4 Dec, 2021
Conference
Sacchettini, Y.; Carrere, J.-P.; Doyen, C.; Duru, R.; Courouble, K.; Ricq, S.; Goiffon, V.; Magnan, P.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :16.5.1-16.5.4 Dec, 2019
Academic Journal
In: Sensors (Switzerland) . (Sensors (Switzerland), 1 January 2020, 20(1))
Conference
Hammad, I.; Ney, D.; Ricq, S.; Cacho, F.; Federspiel, X.; Roy, D.; Josse, E.; Coignus, J.; Perrin, S.; Doyen, C.; Wantz, G.
In: IEEE International Integrated Reliability Workshop Final Report , 2022 IEEE International Integrated Reliability Workshop, IIRW 2022. (IEEE International Integrated Reliability Workshop Final Report, 2022, 2022-October)
Academic Journal
In: Solid-State Electronics . (Solid-State Electronics, June 2015, 108:53-60)
Conference
Steckel, J.S.; Bar, P.; Grange, C.; Mazaleyrat, E.; Rochereau, K.; Josse, E.; Bidaud, M.; Mortini, B.; Bilgen, H.; Arnaud, O.; Allegret-Maret, S.; Saguin, F.; Mazet, L.; Lhostis, S.; Berger, T.; Haxaire, K.; Chapelon, L.L.; Parmigiani, L.; Gouraud, P.; Brihoum, M.; Guillermet, M.; Favreau, S.; Duru, R.; Fantuz, J.; Ricq, S.; Ney, D.; Hammad, I.; Roy, D.; Arnaud, A.; Vianne, B.; Nayak, G.; Virollet, N.; Farys, V.; Malinge, P.; Tournier, A.; Lalanne, F.; Crocherie, A.; Galvier, J.; Rabary, S.; Noblanc, O.; Wehbe-Alause, H.; Pattantyus-Abraham, A.G.; Acharya, S.; Singh, A.; Meitzner, J.; Aher, D.; Yang, H.; Romero, J.; Chen, B.; Sarmiento, M.; Hsu, C.; Cheng, K.C.; Chang, Y.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2021 IEEE International Electron Devices Meeting, IEDM 2021. (Technical Digest - International Electron Devices Meeting, IEDM, 2021, 2021-December:23.4.1-23.4.4)
Academic Journal
Roy, F.; Tournier, A.; Wehbe-Alause, H.; Blanchet, F.; Boulenc, P.; Leverd, F.; Favennec, L.; Perrot, C.; Pinzelli, L.; Gatefait, M.; Cherault, N.; Jeanjean, D.; Carrere, J.P.; Augier, C.; Ricq, S.; Herault, D.; Hulot, S.
In: Physica Status Solidi (C) Current Topics in Solid State Physics . (Physica Status Solidi (C) Current Topics in Solid State Physics, January 2014, 11(1):50-56)
Academic Journal
In: Optical Engineering . (Optical Engineering, 2009, 48(5))
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[AR] Ricq, S.
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