학술논문

Hybrid FDSOI/bulk High-k/metal gate platform for low power (LP) multimedia technology
Document Type
Conference
Source
2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009
Subject
Components, Circuits, Devices and Systems
Robotics and Control Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
High K dielectric materials
High-K gate dielectrics
Random access memory
Electrostatics
Silicon compounds
Silicides
Dielectric devices
Optical films
Tin
Implants
Language
ISSN
0163-1918
2156-017X
Abstract
In this paper, we present FD-SOI with High-K and Single Metal gate as a possible candidate for LP multimedia technology. Dual gate oxide co-integrated devices with EOT 17Å/V dd 1.1V and 29Å/V dd 1.8V are reported. The interest of Ultra-Thin Buried Oxide substrates (UTBOX) is reported in term of Multiple Vt achievement and matching improvement. Delay improvement up to 15% is reported on Ring Oscillators as compared to bulk 45nm devices. In addition, for the first time 99.998% 2Mbit 0.374µm 2 SRAM cut functionality has been demonstrated. Thanks to a hybrid FDSOI/bulk co-integration with UTBOX all IP's required in a SOC are demonstrated for LP applications.