학술논문
'학술논문'
에서 검색결과 418건 | 목록
1~10
Conference
Mota-Frutuoso, T.; Lapras, V.; Brunet, L.; Basset, L.; Lugo, J.; Fenouillet-Beranger, C.; Vinet, M.; Lattard, D.; Boulard, F.; Exbraya, Y.; Boutry, D.; Billoint, O.; Bosch, D.; Maneglia, Y.; Peizerat, A.; Dumas, S.; Sicard, G.; Kerdiles, S.; Kanyandekwe, J.; Sideris, P.; Mazzocchi, V.; Sarrazin, A.; Loup, V.; Mauguen, G.; Morales, C.; Alba, P. Acosta; Balan, V.; Perrot, C.; Sturm, J.; Euvrard, C.; Aussenac, F.; Janaud, A.; Chapon, J-D.; Guillermet, M.; Guglieri, S.; Bailly, F.; Toresani, P.; Fournel, F.; Mouhdach, M.; Berthoud, A.; Chapelon, L-L.; Ribotta, M.; Ponthenier, F.; Magalhaes, A.; Maitrejean, S.; Moulin, C.; Michailos, J.; Arnaud, F.; Cathelin, A.; Arcamone, J.; Andrieu, F.; Garros, X.; Gaillard, F.; Batude., P.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Garros, X.; Divay, A.; Lacord, J.; Serhan, A.; Fache, T.; Antonijevic, J.; Cremer, S.; Knopik, V.; Giry, A.; Charlet, I.; Chouk, R.; Royet, A-S.; Forest, J.; Revil, N.; Cathelin, P.; Chevalier, P.; Roy, D.; Gaillard, F.; Duriez, B.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-8 Oct, 2023
Conference
Cremer, S.; Pelloux, N.; Gianesello, F.; Mourier, Y.; Haury, G.; de Albuquerque, T. Chaves; Monsieur, F.; Audouin, H.; Legrand, C. A.; Diouf, C.; Goncalves, J. Azevedo; Belem Goncalves, C.; Durand, C.; Vulliet, N.; Berthier, L.; Souchier, E.; Garcia, P.; Jan, S.; Hello, M.; Rellier, M. L.; Scheer, P.; Duriez, B.; Garros, X.; Bordignon, T.; Paillardet, F.; Chevalier, P.
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :101-104 Sep, 2023
Academic Journal
Bosch, D.; Garros, X.; Makosiej, A.; Ciampolini, L.; Weber, O.; Lacord, J.; Cluzel, J.; Giraud, B.; Berthelon, R.; Cibrario, G.; Brunet, L.; Batude, P.; Fenouillet-Béranger, C.; Lattard, D.; Colinge, J.P.; Balestra, F.; Andrieu, F.
In Solid State Electronics June 2020 168
Academic Journal
In Microelectronics Reliability September 2019 100-101
Conference
Doyen, C.; Yon, V.; Garros, X.; Basset, L.; Frutuoso, T. Mota; Dagon, C.; Diouf, C.; Federspiel, X.; Millon, V.; Monsieur, F.; Pribat, C.; Roy, D.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Academic Journal
In Microelectronic Engineering 1 November 2015 147:10-14
Academic Journal
Besnard, G.; Garros, X.; Andrieu, F.; Nguyen, P.; Van Den Daele, W.; Reynaud, P.; Schwarzenbach, W.; Delprat, D.; Bourdelle, K.K.; Reimbold, G.; Cristoloveanu, S.
In Solid State Electronics November 2015 113:127-131
Academic Journal
Fenouillet-Beranger, C.; Previtali, B.; Batude, P.; Nemouchi, F.; Cassé, M.; Garros, X.; Tosti, L.; Rambal, N.; Lafond, D.; Dansas, H.; Pasini, L.; Brunet, L.; Deprat, F.; Grégoire, M.; Mellier, M.; Vinet, M.
In Solid State Electronics November 2015 113:2-8
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[AR] Garros, X.
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