학술논문
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1~10
Academic Journal
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Sabouret, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Biénacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouiller, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
In Solid State Electronics 2006 50(4):573-578
Academic Journal
Bienacel, J. ; Barge, D.; Bidaud, M.; Emonet, N.; Roy, D.; Vishnubhotla, L.; Pouilloux, I.; Barla, K.
In Materials Science in Semiconductor Processing 2004 7(4):181-183
Conference
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Saboure, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Bienacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouille, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :423-426 2005
Conference
Denais, M.; Bravaix, A.; Huard, V.; Parthasarathy, C.; Bidaud, M.; Ribes, G.; Barge, D.; Vishnubhotla, L.; Tavel, B.; Rey-Tauriac, Y.; Perrier, F.; Revil, N.; Arnaud, F.; Stolk, P.
IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :121-124 2004
Conference
1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on. :95-99 1993
Conference
Yeap, G.C.-F.; Chen, J.; Grudowski, P.; Jeon, Y.; Shiho, Y.; Qi, W.; Jallepalli, S.; Ramani, N.; Hellig, K.; Vishnubhotla, L.; Luo, T.; Tseng, H.; Du, Y.; Lim, S.; Abramowitz, P.; Reddy, C.; Parihar, S.; Singh, R.; Wright, M.; Patterson, K.; Benavides, N.; Bonser, D.; Gompel, T.V.; Conner, J.; Lee, J.J.; Rendon, M.; Hall, D.; Nghiem, A.; Stout, R.; Weidemann, K.; Duvallet, A.; Alvis, J.; Dyer, D.; Burnett, D.; Ingersoll, P.; Wimmer, K.; Veeraraghavan, S.; Foisy, M.; Hall, M.; Pellerin, J.; Wristers, D.; Woo, M.; Lage, C.
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) VLSI technology VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on. :16-17 2002
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 14(4):196-198 Apr, 1993
Conference
Parihar, S.; Angyal, M.; Boeck, B.; Reber, D.; Singhal, A.; Van Gompel, T.; Li, R.; Wilson, B.; Wright, M.; Chen, J.; Grudowski, P.; Jeon, Y.; Qi, W.; Bai, X.; Parker, L.; Strozewski, K.; Smith, D.; Roling, S.; Sparks, T.; Stephens, T.; Huang, F.; Mora, R.; Aminpur, M.; Hellig, K.; Vishnubhotla, L.; Solomentsev, Y.; Arunachalam, V.; Phillips, A.; Junker, K.; Filipiak, S.; Ramani, N.; Turner, M.; Rendon, M.; Molloy, J.; McGuffin, K.; Michel, A.; Pena, R.; Rose, D.; Schmidt, J.; Smith, M.; Wilson, M.; Terpolilli, L.; Le, P.; Sun, J.; Ross, R.; Yu, K.; Hall, M.; Ingersoll, P.; Woo, M.; Yeap, G.; Lage, C.
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :11.4.1-11.4.4 2001
Conference
Lysaght, P.S.; Nguyen, B.; Bennett, J.; Williamson, G.; Torres, K.; Gilmer, M.; Luo, T.-Y.; Brady, D.; Guan, J.; Brown, G.A.; Zeitzoff, P.; Bersuker, G.; Mucha, J.; Geyling, F.; Gebara, G.; Vishnubhotla, L.; Jackson, M.D.; Huff, H.R.
In: Materials Research Society Symposium - Proceedings . (Materials Research Society Symposium - Proceedings, 1999, 568:283-288)
Academic Journal
Steimle, R.F.; Muralidhar, R.; Rao, R.; Sadd, M.; Swift, C.T.; Yater, J.; Hradsky, B.; Straub, S.; Gasquet, H.; Vishnubhotla, L.; Prinz, E.J.; Merchant, T.; Acred, B.; Chang, K.; White Jr., B.E.
In: Microelectronics Reliability . (Microelectronics Reliability, April 2007, 47 4-5 SPEC. ISS.:585-592)
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[AR] Vishnubhotla, L.
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