학술논문
'학술논문'
에서 검색결과 154건 | 목록
1~10
Conference
Garros, X.; Divay, A.; Lacord, J.; Serhan, A.; Fache, T.; Antonijevic, J.; Cremer, S.; Knopik, V.; Giry, A.; Charlet, I.; Chouk, R.; Royet, A-S.; Forest, J.; Revil, N.; Cathelin, P.; Chevalier, P.; Roy, D.; Gaillard, F.; Duriez, B.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Divay, A.; Forest, J.; Knopik, V.; Hai, J.; Revil, N.; Antonijevic, J.; Michard, A.; Cacho, F.; Vincent, E.; Gaillard, F.; Garros, X.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :39.3.1-39.3.4 Dec, 2021
Conference
Gianesello, F.; Monroy, A.; Vialla, V.; Canderle, E.; Bertrand, G.; Buczko, M.; Coly, M.; Nowakowski, Jeff; Revil, N.; Rolland, L.; Gloria, D.; Juge, A.; Gachon, S.; Aubert, J. P.; Granger, E.
2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2016 IEEE 16th Topical Meeting on. :9-12 Jan, 2016
Conference
Garros, X.; Knopik, V.; Revil, N.; Divay, A.; Cluzel, J.; Lugo, J.; Giry, A.; Federspiel, X.; Bertrand, G.; Cacho, F.; Vincent, E.; Granger, E.; Gaillard, F.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :25.5.1-25.5.4 Dec, 2019
Academic Journal
Bravaix, A.; Goguenheim, D.; Denais, M.; Huard, V.; Parthasarathy, C.; Perrier, F.; Revil, N.; Vincent, E.
In Microelectronics Reliability 2005 45(9):1370-1375
Academic Journal
In Microelectronics Reliability 2005 45(1):83-98
Academic Journal
In Microelectronics Reliability 2004 44(1):65-77
Academic Journal
In Microelectronics Reliability 2003 43(8):1241-1246
Academic Journal
In Journal of Non-Crystalline Solids 2003 322(1):100-104
Academic Journal
In Microelectronic Engineering 2001 59(1):101-108
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제한된 항목
[AR] Revil, N.
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