학술논문
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Academic Journal
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Sabouret, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Biénacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouiller, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
In Solid State Electronics 2006 50(4):573-578
Academic Journal
In Microelectronic Engineering 2003 67:70-77
Academic Journal
Manakli, S. ; Trouiller, Y.; Schiavone, P.; Spinelli, P.; Le-Borgne, O.; Chollet, J.-P.; Rody, Y.; Goirand, P.-J.
In Microelectronic Engineering 2002 61:123-132
Conference
Devoivre, T.; Lunenborg, M.; Julien, C.; Carrere, J.-P.; Ferreira, P.; Toren, W.J.; VandeGoor, A.; Gayet, P.; Berger, T.; Hinsinger, O.; Vannier, P.; Trouiller, Y.; Rody, Y.; Goirand, P.-J.; Palla, R.; Thomas, I.; Guyader, F.; Roy, D.; Borot, B.; Planes, N.; Naudet, S.; Pico, F.; Duca, D.; Lalanne, F.; Heslinga, D.; Haond, M.
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) Memory technology design and testing Memory Technology, Design and Testing, 2002. (MTDT 2002). Proceedings of the 2002 IEEE International Workshop on. :157-162 2002
Conference
Digest of Papers. Microprocesses and Nanotechnology'98. 198 International Microprocesses and Nanotechnology Conference (Cat. No.98EX135) Microprocess and nanotechnology Microprocesses and Nanotechnology Conference, 1998 International. :77-80 1998
Copper dual damascene integration using organic low k material: construction architecture comparison
Conference
Morand, Y.; Assous, M.; Berruyer, P.; Cochet, M.; Demolliens, O.; Fayolle, M.; Louis, D.; Passemard, G.; Roman, A.; Verove, C.; Trouiller, Y.
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) Interconnect technology Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International. :225-227 2000
Academic Journal
Borjon, A.; Belledent, J.; Couderc, C.; Rody, Y.; Cam, L.L.; Trouiller, Y.; Gardin, C.; Yesilada, E.; Montgomery, P.; Willkinson, B.; Saied, M.; Sundermann, F.; Urbani, J.-C.; Foussadier, F.; Planchot, J.; Martinelli, C.; Kerrien, G.; Vautrin, F.; Robert, F.; Schiavone, P.
In: Microelectronic Engineering , Proceedings of the 32nd International Conference on Micro- and Nano-Engineering. (Microelectronic Engineering, May 2007, 84(5-8):741-745)
Academic Journal
Gardin, C.; Yesilada, E.; Saied, M.; Belledent, J.; Borjon, A.; Couderc, C.; Rody, Y.; Trouiller, Y.; Foussadier, F.; Urbani, J.-C.; Sundermann, F.; Planchot, J.; Robert, F.
In: Microelectronic Engineering , Proceedings of the 32nd International Conference on Micro- and Nano-Engineering. (Microelectronic Engineering, May 2007, 84(5-8):770-773)
Academic Journal
Borjon, A.; Belledent, J.; Couderc, C.; Rody, Y.; Trouiller, Y.; Patterson, K.; Lucas, K.; Gardin, C.; Sundermann, F.; Urbani, J.-C.; Baron, S.; Foussadier, F.; Schiavone, P.
In: Microelectronic Engineering . (Microelectronic Engineering, April 2006, 83 4-9 SPEC. ISS.:1017-1022)
Academic Journal
In: Journal of Microlithography, Microfabrication and Microsystems . (Journal of Microlithography, Microfabrication and Microsystems, April 2004, 3(2):305-315)
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제한된 항목
[AR] Trouiller, Y.
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