학술논문
'학술논문'
에서 검색결과 158건 | 목록
1~10
Academic Journal
IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 18:999-1004 2019
Academic Journal
In Materials Science in Semiconductor Processing 2006 9(6):995-999
Conference
Razavieh, A.; Deng, Y.; Zeitzoff, P.; Na, M.R.; Frougier, J.; Karve, G.; Brown, D.E.; Yamashita, T.; Nowak, E.J.
2018 76th Device Research Conference (DRC) Device Research Conference (DRC), 2018 76th. :1-2 Jun, 2018
Conference
2017 75th Annual Device Research Conference (DRC) Device Research Conference (DRC), 2017 75th Annual. :1-2 Jun, 2017
Conference
2005 International Conference On Simulation of Semiconductor Processes and Devices Simulation of Semiconductor Processes and Devices, 2005. SISPAD 2005. International Conference on. :27-30 2005
Conference
Harris, H.R.; Choi, R.; Lee, B.H.; Young, C.D.; Sim, J.H.; Mathews, K.; Zeitzoff, P.; Majhi, P.; Bersuker, G.
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :80-83 2005
Conference
Young, C.D.; Choi, R.; Sim, J.H.; Lee, B.H.; Zeitzoff, P.; Zhao, Y.; Matthews, K.; Brown, G.A.; Bersuker, G.
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :75-79 2005
Conference
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :398-402 2005
Conference
Xie, R.; Montanini, P.; Akarvardar, K.; Tripathi, N.; Haran, B.; Johnson, S.; Hook, T.; Hamieh, B.; Corliss, D.; Wang, J.; Miao, X.; Sporre, J.; Fronheiser, J.; Loubet, N.; Sung, M.; Sieg, S.; Mochizuki, S.; Prindle, C.; Seo, S.; Greene, A.; Shearer, J.; Labonte, A.; Fan, S.; Liebmann, L.; Chao, R.; Arceo, A.; Chung, K.; Cheon, K.; Adusumilli, P.; Amanapu, H.P.; Bi, Z.; Cha, J.; Chen, H.-C.; Conti, R.; Galatage, R.; Gluschenkov, O.; Kamineni, V.; Kim, K.; Lee, C.; Lie, F.; Liu, Z.; Mehta, S.; Miller, E.; Niimi, H.; Niu, C.; Park, C.; Park, D.; Raymond, M.; Sahu, B.; Sankarapandian, M.; Siddiqui, S.; Southwick, R.; Sun, L.; Surisetty, C.; Tsai, S.; Whang, S.; Xu, P.; Xu, Y.; Yeh, C.; Zeitzoff, P.; Zhang, J.; Li, J.; Demarest, J.; Arnold, J.; Canaperi, D.; Dunn, D.; Felix, N.; Gupta, D.; Jagannathan, H.; Kanakasabapathy, S.; Kleemeier, W.; Labelle, C.; Mottura, M.; Oldiges, P.; Skordas, S.; Standaert, T.; Yamashita, T.; Colburn, M.; Na, M.; Paruchuri, V.; Lian, S.; Divakaruni, R.; Gow, T.; Lee, S.; Knorr, A.; Bu, H.; Khare, M.
2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :2.7.1-2.7.4 Dec, 2016
Conference
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :21-24 2004
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제한된 항목
[AR] Zeitzoff, P.
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