학술논문
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Academic Journal
In Microelectronic Engineering 2006 83(4):749-753
Conference
van Haren, R.; Li, S.; Baars, M.; Minghetti, B.; van Dijk, L.; Mendes, I.; Abadie, K.; Pourteau, M.-L.; Mauguen, G.; May, M.; Balan, V.; Fournel, F.; Pain, L.; Plach, T.; Probst, G.; Wimplinger, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Novel Patterning Technologies 2024. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12956)
Conference
Fenouillet-Beranger, C.; Denorme, S.; Icard, B.; Boeuf, F.; Coignus, J.; Faynot, O.; Brevard, L.; Buj, C.; Soonekindt, C.; Todeschini, J.; Le-Denmat, J.C.; Loubet, N.; Gallon, C.; Perreau, P.; Manakli, S.; Minghetti, B.; Pain, L.; Arnal, V.; Vandooren, A.; Aime, D.; Tosti, L.; Savardi, C.; Broekaart, M.; Gouraud, P.; Leverd, F.; Dejonghe, V.; Brun, P.; Guillermet, M.; Aminpur, M.; Barnola, S.; Rouppert, F.; Martin, F.; Salvetat, T.; Lhostis, S.; Laviron, C.; Auriac, N.; Kormann, T.; Chabanne, G.; Gaillard, S.; Belmont, O.; Laffosse, E.; Barge, D.; Zauner, A.; Tarnowka, A.; Romanjec, K.; Brut, H.; Lagha, A.; Bonnetier, S.; Joly, F.; Mayet, N.; Cathignol, A.; Galpin, D.; Pop, D.; Delsol, R.; Pantel, R.; Pionnier, F.; Thomas, G.; Bensahel, D.; Deleonibus, S.; Skotnicki, T.; Mingam, H.
2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :267-270 Dec, 2007
Conference
Josse, E.; Parihar, S.; Callen, O.; Ferreira, P.; Monget, C.; Farcy, A.; Zaleski, M.; Villanueva, D.; Ranica, R.; Bidaud, M.; Barge, D.; Laviron, C.; Auriac, N.; Le Cam, C.; Harrison, S.; Warrick, S.; Leverd, F.; Gouraud, P.; Zoll, S.; Guyader, F.; Perrin, E.; Baylac, E.; Belledent, J.; Icard, B.; Minghetti, B.; Manakli, S.; Pain, L.; Huard, V.; Ribes, G.; Rochereau, K.; Bordez, S.; Blanc, C.; Margain, A.; Delille, D.; Pantel, R.; Barla, K.; Cave, N.; Haond, M.
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Conference
Manakli, S.; Docherty, K.; Pain, L.; Todeschini, J.; Jurdit, M.; Icard, B.; Leseuil, S.; Minghetti, B.
Digest of Papers Microprocesses and Nanotechnology 2005 Microprocesses and Nanotechnology 2005 Microprocesses and Nanotechnology Conference, 2005 International. :242 2005
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
Conference
d'Ouville, T. Ternisien; Basset, R.; Amm, D.T.; Ravezzani, S.; Delpech, P.; Moi, D.; Paoli, M.; Minghetti, B.; Mingam, H.
ESSDERC '87: 17th European Solid State Device Research Conference Solid State Device Research Conference, 1987. ESSDERC '87. 17th European. :679-682 Sep, 1987
Conference
Proceedings of SPIE; Nov2007, Issue 1, p653319-653319-9, 9p
Conference
Pain, L.; Jurdit, M.; Todeschini, J.; Manakli, S.; Icard, B.; Minghetti, B.; Bervin, G.; Beverina, A.; Leverd, F.; Broekaart, M.; Gouraud, P.; De Jonghe, V.; Brun, Ph.; Denorme, S.; Boeuf, F.; Wang, V.; Henry, D.
Proceedings of SPIE; Nov2005, Issue 1, p35-45, 11p
Conference
Todeschini, J.; Pain, Laurent; Manakli, S.; Icard, B.; DeJonghe, V.; Minghetti, B.; Jurdit, M.; Henry, D.; Wang, V.
Proceedings of SPIE; Nov2005, Issue 1, p408-416, 9p
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제한된 항목
[AR] Minghetti, B.
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