학술논문
'학술논문'
에서 검색결과 46건 | 목록
1~10
Academic Journal
Cartelier, K.; Aimé, D.; Gallardo, K.; Le Signor, C.; Ly Vu, J.; Buitink, J.; Combes-Soia, L.; Labas, V.; Prosperi, J.-M.
In: Plant Journal . (Plant Journal, June 2021, 106(5):1298-1311)
Totally Silicided (TOSI) Gates as an evolutionary metal gate solution for advanced CMOS technologies
Conference
2006 IEEE International Conference on IC Design and Technology Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on. :1-6 2006
Academic Journal
In: Journal of Experimental Botany . (Journal of Experimental Botany, 29 March 2021, 72(7):2611-2626)
Conference
Mondot, A.; Muller, M.; Aime, D.; Froment, B.; Cacho, F.; Talbot, A.; Leverd, F.; Rivoire, M.; Morand, Y.; Descombes, S.; Besson, P.; Toffoli, A.; Pokrant, S.; Skotnicki, T.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :427-430 2005
Conference
Muller, M.; Mondot, A.; Aime, D.; Froment, B.; Talbot, A.; Roux, J.-M.; Ribes, G.; Morand, Y.; Descombes, S.; Gouraud, P.; Leverd, F.; Pokrant, S.; Toffoli, A.; Skotnicki, T.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :453-456 2005
Conference
Muller, M.; Mondot, A.; Gierczynski, N.; Aime, D.; Froment, B.; Leverd, F.; Gouraud, P.; Talbot, A.; Descombes, S.; Morand, Y.; Le Tiec, Y.; Besson, P.; Toffoli, A.; Ribes, G.; Roux, J.-M.; Pokrant, S.; Andre, F.; Skotnicki, T.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :626-629 2005
Conference
Aime, D.; Froment, B.; Cacho, F.; Carron, V.; Descombes, S.; Morand, Y.; Emonet, N.; Wacquant, F.; Farjot, T.; Jullian, S.; Laviron, C.; Juhel, M.; Pantel, R.; Molins, R.; Delille, D.; Halimaoui, A.; Bensahel, D.; Souifi, A.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :87-90 2004
Academic Journal
Hufnagel, B.; Marques, A.; Soriano, A.; Marquès, L.; Divol, F.; Doumas, P.; Laguerre, M.; Péret, B.; Sallet, E.; Carrere, S.; Gouzy, J.; Mancinotti, D.; Geu-Flores, F.; Marande, W.; Arribat, S.; Bergès, H.; Keller, J.; Delaux, P.-M.; Huneau, C.; Salse, J.; Blein, T.; Crespi, M.; Aimé, D.; Gallardo, K.; Taylor, J.; Nelson, M.; Schubert, V.; Guyot, R.
In: Nature Communications . (Nature Communications, 1 December 2020, 11(1))
Conference
Greene, B.; Liang, Q.; Amarnath, K.; Wang, Y.; Schaeffer, J.; Cai, M.; Liang, Y.; Saroop, S.; Cheng, J.; Rotondaro, A.; Han, S.-J.; Mo, R.; McStay, K.; Ku, S.; Pal, R.; Kumar, M.; Dirahoui, B.; Yang, B.; Tamweber, F.; Lee, W.-H.; Steigerwalt, M.; Weijtmans, H.; Holt, J.; Black, L.; Samavedam, S.; Turner, M.; Ramani, K.; Lee, D.; Belyansky, M.; Chowdhury, M.; Aime, D.; Min, B.; van Meer, H.; Yin, H.; Chan, K.; Angyal, M.; Zaleski, M.; Ogunsola, O.; Child, C.; Zhuang, L.; Yan, H.; Permanaa, D.; Sleight, J.; Guo, D.; Mittl, S.; Ioannou, D.; Wu, E.; Chudzik, M.; Park, D.-G.; Brown, D.; Luning, S.; Mocuta, D.; Maciejewski, E.; Henson, K.; Leobandung, E.
2009 Symposium on VLSI Technology VLSI Technology, 2009 Symposium on. :140-141 Jun, 2009
Conference
Yang, B.; Takalkar, R.; Ren, Z.; Black, L.; Dube, A.; Weijtmans, J.W.; Li, J.; Johnson, J.B.; Faltermeier, J.; Madan, A.; Zhu, Z.; Turansky, A.; Xia, G.; Chakravarti, A.; Pal, R.; Chan, K.; Reznicek, A.; Adam, T.N.; de Souza, J.P.; Harley, E.C.T.; Greene, B.; Gehring, A.; Cai, M.; Aime, D.; Sun, S.; Meer, H.; Holt, J.; Theodore, D.; Zollner, S.; Grudowski, P.; Sadana, D.; Park, D.-G.; Mocuta, D.; Schepis, D.; Maciejewski, E.; Luning, S.; Pellerin, J.; Leobandung, E.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008
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[AR] Aime, D.
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