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Academic Journal
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Sabouret, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Biénacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouiller, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
In Solid State Electronics 2006 50(4):573-578
Conference
Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Biopolar/BiCMOS Circuits and Technology Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the. :62-65 2005
Conference
Difrenza, R.; Rochereau, K.; Devoivre, T.; Tavel, B.; Duriez, B.; Roy, D.; Jullian, S.; Dezzani, A.; Boulestin, R.; Stolk, P.; Arnaud, F.
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :137-142 2005
Conference
Tavel, B.; Duriez, B.; Gwoziecki, R.; Basso, M.T.; Julien, C.; Ortolland, C.; Laplanche, Y.; Fox, R.; Saboure, E.; Detcheverry, C.; Boeuf, F.; Morin, P.; Barge, D.; Bidaud, M.; Bienacel, J.; Garnier, P.; Cooper, K.; Chapon, J.D.; Trouille, Y.; Belledent, J.; Broekaart, M.; Gouraud, P.; Denais, M.; Huard, V.; Rochereau, K.; Difrenza, R.; Planes, N.; Marin, M.; Boret, S.; Gloria, D.; Vanbergue, S.; Abramowitz, P.; Vishnubhotla, L.; Reber, D.; Stolk, P.; Woo, M.; Arnaud, F.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :423-426 2005
Conference
Duriez, B.; Morin, P.; Tavel, B.; Froment, B.; Gouraud, P.; Roy, D.; Rochereau, K.; Difrenza, R.; Margin, A.; Denais, M.; Bidaud, M.; Stolk, P.; Woo, M.; Arnaud, F.
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :197-200 2004
Conference
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :123-126 2004
Conference
Duriez, B.; Tavel, B.; Boeuf, R.; Basso, M.T.; Laplanche, Y.; Ortolland, C.; Reber, D.; Wacquant, R.; Morin, P.; Lenoble, D.; Palla, R.; Bidaud, M.; Barge, D.; Dachs, C.; Brut, H.; Roy, D.; Marin, M.; Payet, F.; Cagnat, N.; Difrenza, R.; Rochereau, K.; Denais, M.; Stolk, P.; Woo, M.; Arnaud, F.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :847-850 2004
Conference
International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :244-249 2003
Conference
Croon, J.A.; Tuinhout, H.P.; Difrenza, R.; Knol, J.; Moonen, A.J.; Decoutere, S.; Maes, H.E.; Sansen, W.
Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. Microelectronic test structures Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on. :235-240 2002
Conference
Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. Microelectronic test structures Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on. :241-246 2002
검색 결과 제한하기
제한된 항목
[AR] Difrenza, R.
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