학술논문
'학술논문'
에서 검색결과 626건 | 목록
1~10
Academic Journal
In Solid State Electronics 2007 51(8):1101-1108
Academic Journal
Vassilev, V.; Thijs, S.; Segura, P.L.; Wambacq, P.; Leroux, P.; Groeseneken, G.; Natarajan, M.I.; Maes, H.E.; Steyaert, M.
In Microelectronics Reliability 2005 45(2):255-268
Academic Journal
Vassilev, V.; Jenei, S.; Groeseneken, G.; Venegas, R.; Thijs, S.; De Heyn, V.; Natarajan, M.; Steyaert, M.; Maes, H.E.
In Microelectronics Reliability 2003 43(7):1011-1020
Conference
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :193-196 2004
Conference
Croon, J.A.; Leunissen, L.H.A.; Jurczak, M.; Benndorf, M.; Rooyackers, R.; Ronse, K.; Decoutere, S.; Sansen, W.; Maes, H.E.
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :227-230 2003
Conference
Vassilev, V.; Lorenzini, M.; Jansen, P.; Vashchenko, V.; Yang, J.-J.; Concannon, A.; Archer, D.; Groeseneken, G.; Natarajan, M.I.; Terbeek, M.; Thijs, S.; Choi, B.-J.; Steyaert, M.; Maes, H.E.
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :561-564 2003
Conference
Kerber, A.; Cartier, E.; Pantisano, L.; Rosmeulen, M.; Degraeve, R.; Kauerauf, T.; Groeseneken, G.; Maes, H.E.; Schwalke, U.
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :41-45 2003
Conference
Croon, J.A.; Tuinhout, H.P.; Difrenza, R.; Knol, J.; Moonen, A.J.; Decoutere, S.; Maes, H.E.; Sansen, W.
Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. Microelectronic test structures Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on. :235-240 2002
Conference
32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :579-582 2002
Conference
Croon, J.A.; Storms, G.; Winkelmeier, S.; Pollentier, I.; Ercken, M.; Decoutere, S.; Sansen, W.; Maes, H.E.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :307-310 2002
검색 결과 제한하기
제한된 항목
[AR] Maes, H.E.
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