학술논문
'학술논문'
에서 검색결과 93건 | 목록
1~10
Conference
Sy, F.; Rafhay, Q.; Poette, J.; Grosa, G.; Besset, C.; Beylier, G.; Grosse, P.; Roy, D.; Broquin, J.-E.
2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-5 Mar, 2019
Conference
2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018
Academic Journal
In Microelectronic Engineering 2007 84(9):2310-2313
Conference
Lhostis, S.; Farcy, A.; Deloffre, E.; Lorut, F.; Mermoz, S.; Henrion, Y.; Berthier, L.; Bailly, F.; Scevola, D.; Guyader, F.; Gigon, F.; Besset, C.; Pellissier, S.; Gay, L.; Hotellier, N.; Le Berrigo, A. -L.; Moreau, S.; Balan, V.; Fournel, F.; Jouve, A.; Cheramy, S.; Arnoux, M.; Rebhan, B.; Maier, G. A.; Chitu, L.
2016 IEEE 66th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2016 IEEE 66th. :869-876 May, 2016
Academic Journal
In Microelectronics Reliability 2003 43(8):1237-1240
Conference
Bravaix, A.; Guerin, C.; Goguenheim, D.; Huard, V.; Roy, D.; Besset, C.; Renard, S.; Randriamihaja, Y. Mamy; Vincent, E.
2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :55-64 May, 2010
Conference
Vilmay, M.; Roy, D.; Besset, C.; Galpin, D.; Monget, C.; Vannier, P.; Le Friec, Y.; Imbert, G.; Mellier, M.; Petitdidier, S.; Robin, O.; Guillan, J.; Chhun, S.; Arnaud, L.; Volpi, F.; Chaix, J.-M.
2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :122-124 Jun, 2009
Conference
Arnaud, L.; Galpin, D.; Chhun, S.; Monget, C.; Richard, E.; Roy, D.; Besset, C.; Vilmay, M.; Doyen, L.; Waltz, P.; Petitprez, E.; Terrier, F.; Imbert, G; Le Friec, Y
2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :179-181 Jun, 2009
Conference
2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :1-21 Oct, 2008
Conference
2008 26th International Conference on Microelectronics Microelectronics, 2008. MIEL 2008. 26th International Conference on. :537-540 May, 2008
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제한된 항목
[AR] Besset, C.
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