학술논문
'학술논문'
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1~10
Academic Journal
In Solid State Electronics December 2012 78:151-155
Conference
Weber, O.; Pigot, C.; Berthelon, R.; Gandolfo, A.; Mattavelli, P.; Jasse, J.; Samanni, G.; Gomiero, E.; Richard, E.; Grenier, J. C.; Ranica, R.; Chouteau, S.; Beneyton, R.; Duclaux, B.; Beylier, C.; Pelissier, D.; Gallon, C.; Toulouse, C.; Jenny, C.; Croisy, M.; Borowiak, C.; Haendler, S.; Ogier, J.L.; Batail, E.; Gilibert, F.; Boivin, P.; Turgis, D.; Conte, A.; Disegni, F.; Redaelli, A.; Annunziata, R.; Cappelletti, P.; Piazza, F.; Ferreira, P.; Arnaud, F.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Academic Journal
In Solid State Electronics 2008 52(10):1550-1554
Conference
2014 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2014 International. :197-200 Oct, 2014
Conference
Arnaud, F.; Zuliani, P.; Reynard, J.P.; Gandolfo, A.; Disegni, F.; Mattavelli, P.; Gomiero, E.; Samanni, G.; Jahan, C.; Berthelon, R.; Weber, O.; Richard, E.; Barral, V.; Villaret, A.; Kohler, S.; Grenier, J.C.; Ranica, R.; Gallon, C.; Souhaite, A.; Ristoiu, D.; Favennec, L.; Caubet, V.; Delmedico, S.; Cherault, N.; Beneyton, R.; Chouteau, S.; Sassoulas, P.O.; Vernhet, A.; Le Friec, Y.; Domengie, F.; Scotti, L.; Pacelli, D.; Ogier, J.L.; Boucard, F.; Lagrasta, S.; Benoit, D.; Clement, L.; Boivin, P.; Ferreira, P.; Annunziata, R.; Cappelletti, P.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :18.4.1-18.4.4 Dec, 2018
Conference
Proceedings of International Reliability Physics Symposium Reliability physics Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International. :44-54 1996
Conference
International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :327-330 1996
Conference
Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on. :1651-1654 1996
Conference
2007 International Semiconductor Device Research Symposium Semiconductor Device Research Symposium, 2007 International. :1-2 Dec, 2007
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 45(4):904-911 Apr, 1998
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제한된 항목
[AR] Ogier, J.L.
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